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1. (WO2018045389) PRECISION AIMING SYSTEMS AND METHODS
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Pub. No.: WO/2018/045389 International Application No.: PCT/US2017/050136
Publication Date: 08.03.2018 International Filing Date: 05.09.2017
IPC:
F41G 1/16 (2006.01) ,F41G 1/20 (2006.01) ,F41G 3/00 (2006.01)
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
41
WEAPONS
G
WEAPON SIGHTS; AIMING
1
Sighting devices
06
Rearsights
16
Adjusting mechanisms therefor; Mountings therefor
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
41
WEAPONS
G
WEAPON SIGHTS; AIMING
1
Sighting devices
06
Rearsights
16
Adjusting mechanisms therefor; Mountings therefor
20
coarse and fine
F MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
41
WEAPONS
G
WEAPON SIGHTS; AIMING
3
Aiming means; Laying means
Applicants:
MCCOY II, Charles, A. [US/US]; US
Inventors:
MCCOY II, Charles, A.; US
Agent:
SCHACHT, Michael, R.; US
Priority Data:
62/383,47004.09.2016US
Title (EN) PRECISION AIMING SYSTEMS AND METHODS
(FR) PROCÉDÉS ET SYSTÈMES DE VISÉE DE PRÉCISION
Abstract:
(EN) An aiming device comprises a base plate, a top plate, a pivot assembly, a pivot groove, and first and second adjustment systems. The pivot assembly connects the top plate to the base plate for rotation about a first pivot axis. The pivot groove is formed in the top plate to allow deformation of at least a portion of the top plate relative to the base plate about a second pivot axis. The first adjustment system causes relative movement between the top plate and the base plate relative about the first pivot axis. The second adjustment system causes relative movement between at least a portion of the top plate and the bottom plate about the second pivot axis.
(FR) L'invention concerne un dispositif de visée comprenant une plaque de base, une plaque supérieure, un ensemble pivot, une rainure de pivot et des premier et second systèmes de réglage. L'ensemble pivot relie la plaque supérieure à la plaque de base pour une rotation autour d'un premier axe de pivot. La rainure de pivot est formée dans la plaque supérieure pour permettre la déformation d'au moins une partie de la plaque supérieure par rapport à la plaque de base autour d'un second axe de pivot. Le premier système de réglage provoque un mouvement relatif entre la plaque supérieure et la plaque de base autour du premier axe de pivot. Le second système de réglage provoque un mouvement relatif entre au moins une partie de la plaque supérieure et la plaque inférieure autour du second axe de pivot.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)