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1. (WO2018045227) SELF TEST FOR SAFETY LOGIC
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/045227 International Application No.: PCT/US2017/049720
Publication Date: 08.03.2018 International Filing Date: 31.08.2017
IPC:
G01R 31/3183 (2006.01) ,G01R 31/3187 (2006.01) ,G06F 11/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
3183
Generation of test inputs, e.g. test vectors, patterns or sequences
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
31
Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
28
Testing of electronic circuits, e.g. by signal tracer
317
Testing of digital circuits
3181
Functional testing
3187
Built-in tests
G PHYSICS
06
COMPUTING; CALCULATING; COUNTING
F
ELECTRIC DIGITAL DATA PROCESSING
11
Error detection; Error correction; Monitoring
Applicants: TEXAS INSTRUMENTS INCORPORATED[US/US]; P.O. Box 655474, Mail Station 3999 Dallas, TX 75265-5474, US
TEXAS INSTRUMENTS JAPAN LIMITED[JP/JP]; 24-1, Nishi-Shinjuku 6-chome Shinjuku-ku, 160-8366, JP (JP)
Inventors: RANGACHARI, Sundarrajan; IN
JALAN, Saket; IN
Agent: DAVIS, Michael A. Jr.; US
DAVIS, Michael, A.; US
Common
Representative:
TEXAS INSTRUMENTS INCORPORATED; P.O. Box 655474, Mail Station 3999 Dallas, TX 75265-5474, US
Priority Data:
15/255,04401.09.2016US
Title (EN) SELF TEST FOR SAFETY LOGIC
(FR) AUTO-TEST POUR LOGIQUE DE SÉCURITÉ
Abstract:
(EN) In described examples of self test logic for safety logic (100) in safety critical devices, the safety logic (100) includes comparator logic coupled to a master module (300) and a compare module (302) in a safety critical device, and the self test logic is configured to test the comparator logic. The self test logic may be implemented as a single cycle parallel bit inversion approach, a multi-cycle serial bit inversion approach, or a single cycle test pattern injection approach.
(FR) Dans des exemples décrits de logique d'auto-test pour logique de sécurité (100) dans des dispositifs critiques de sécurité, la logique de sécurité (100) comprend une logique de comparateur couplée à un module maître (300) et à un module de comparaison (302) dans un dispositif critique de sécurité, et la logique d'auto-test est configurée pour tester la logique de comparateur. La logique d'auto-test peut être mise en œuvre sous la forme d'une approche d'inversion de bits parallèle à un seul cycle, d'une approche d'inversion de bits série à cycles multiples, ou d'une approche d'injection de motif de test à cycle unique.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)