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1. (WO2018044519) APPARATUS AND METHOD FOR IN SITU ANALOG SIGNAL DIAGNOSTIC AND DEBUGGING WITH CALIBRATED ANALOG-TO-DIGITAL CONVERTER
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CLAIMS

1. An apparatus, comprising:

an integrated circuit (IC) chip comprising:

a first core configured to generate a first set of one or more analog signals;

a reference generator configured to generate a set of one or more reference signals;

an analog-to-digital converter (ADC) configured to generate a digital signal based on a selected one of the first set of one or more analog signals; and

a switching network configured to:

selectively route a selected one of the set of one or more reference signals to the ADC for calibrating the ADC; and

selectively route the selected one of the first set of one or more analog signals to the ADC for generating the digital signal.

2. The apparatus of claim 1, wherein the reference generator, the switching network, and the ADC are implemented in a second core of the IC chip.

3. The apparatus of claim 1, wherein at least one of the set of one or more reference signals are applied to the first core.

4. The apparatus of claim 1, wherein the IC chip further comprises a memory core configured to store the digital signal.

5. The apparatus of claim 4, further comprising a test interface circuit coupled to the ADC and the memory core.

6. The apparatus of claim 5, wherein the test interface circuit is implemented in the IC chip.

7. The apparatus of claim 5, further comprising an IC package, wherein the IC chip is enclosed within the IC package.

8. The apparatus of claim 7, wherein the IC package further comprises at least one ball grid array (BGA) ball coupled to the test interface circuit, wherein the at least one BGA ball is configured to be coupled to a test equipment for outputting the digital signal for analysis purposes.

9. The apparatus of claim 1, further comprising a controller configured to generate a control signal for controlling the switching network to route the selected one of the one or more reference signals to the ADC and the selected one of the one or more analog signals to the ADC.

10. The apparatus of claim 1, wherein the IC chip further comprises a second core configured to generate a second set of one or more analog signals; and further comprising an analog bus coupled to the first and second cores and to the switching network, wherein the analog bus and the switching network are configured to route a selected one of the first set of one or more analog signals or the second set of one or more analog signals to the ADC.

11. The apparatus of claim 10, wherein the analog bus is implemented within the IC chip.

12. The apparatus of claim 11, further comprising an IC package, wherein the IC chip is enclosed within the IC package.

13. The apparatus of claim 12, wherein the IC package further comprises at least one ball grid array (BGA) ball coupled to the analog bus.

14. The apparatus of claim 13, wherein the at least one BGA ball is configured to be coupled to a test equipment for outputting the selected one of the analog signal from the first set of one or more analog signals or the second set of one or more analog signals for analysis purposes.

15. The apparatus of claim 13, wherein the at least one BGA ball is configured to be coupled to a source of an external reference signal, wherein the analog bus and the switching network is configured to route the external reference signal to the ADC for calibration of the ADC.

16. The apparatus of claim 12, wherein the analog bus is implemented as an interconnect of the IC package.

17. A method, comprising:

generating an analog signal within a first core of an integrated circuit (IC) chip; generating a reference signal within a second core of the IC chip; and generating a digital signal within the IC chip based on the analog signal and the reference signal.

18. The method of claim 17, wherein generating the digital signal occurs within the second core of the IC chip.

19. The method of claim 17, further comprising storing the digital signal within a memory core of the IC.

20. The method of claim 19, further comprising routing the digital signal from the memory core of the IC to an external test equipment.

21. The method of claim 17, further comprising routing the analog signal from the second core of the IC to an external test equipment.

22. The method of claim 17, further comprising:

generating a second analog signal within a third core of the IC;

generating a second digital signal within the IC chip based on the second analog signal and the reference signal or another reference signal; and

storing the first digital signal and second digital signal in a memory core within the IC.

23. The method of claim 22, further comprising routing the first digital signal and the second digital signal from the memory core of the IC to an external test equipment.

24. An apparatus, comprising:

means for generating an analog signal within a first core of an integrated circuit (IC) chip;

means for generating a reference signal within a second core of the IC chip; and means for generating a digital signal within the IC chip based on the analog signal and the reference signal.

25. The apparatus of claim 24, wherein the means for generating the digital signal is implemented within the second core of the IC chip.

26. The apparatus of claim 24, further comprising means for storing the digital signal within the IC.

27. The apparatus of claim 24, further comprising means for routing the digital signal from the means for storing to an external test equipment.

28. The apparatus of claim 17, further comprising means for routing the analog signal from the second core of the IC to an external test equipment.

29. The apparatus of claim 24, further comprising:

means for generating a second analog signal within a third core of the IC;

means for generating a second digital signal within the IC chip based on the second analog signal and the reference signal or another reference signal; and

means for storing the first digital signal and second digital signal in a memory core within the IC.

30. The method of claim 29, further comprising means for routing the first digital signal and the second digital signal from the memory core of the IC to an external test equipment.