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1. (WO2018044373) OPTICAL CALIBRATOR, CALIBRATION SYSTEM, AND METHOD
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Pub. No.: WO/2018/044373 International Application No.: PCT/US2017/035900
Publication Date: 08.03.2018 International Filing Date: 05.06.2017
IPC:
G01J 5/04 (2006.01) ,G01J 5/52 (2006.01) ,G01J 5/08 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5
Radiation pyrometry
02
Details
04
Casings
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5
Radiation pyrometry
50
using techniques specified in the subgroups below
52
using comparison with reference sources, e.g. disappearing-filament pyrometer
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
5
Radiation pyrometry
02
Details
08
Optical features
Applicants:
RAYTHEON COMPANY [US/US]; 870 Winter Street Waltham, MA 02451-1449, US
Inventors:
ZIMMERMAN, Andrew, J.; US
SPENCER, Susan, B.; US
MENENDEZ, Michael, L.; US
Agent:
GATES, Sarah, M.; US
GERSTENZANG, Gregory, K.; US
ANDREASEN, David, S.; US
HARRIS, Nathan, T.; US
ANASTASI, John, N.; US
Priority Data:
15/252,43031.08.2016US
Title (EN) OPTICAL CALIBRATOR, CALIBRATION SYSTEM, AND METHOD
(FR) APPAREIL D'ÉTALONNAGE OPTIQUE, SYSTÈME D'ÉTALONNAGE, ET PROCÉDÉ
Abstract:
(EN) Calibration devices, systems, and methods for calibrating a sensor. In one example a calibrator includes a housing, a dual-axis mirror positioning mechanism disposed within the housing, and a single calibration mirror coupled to the dual-axis mirror positioning mechanism and disposed within the housing, the dual-axis mirror positioning mechanism being configured to rotate the calibration mirror about a first axis to move the calibration mirror from a stowed position into a deployed position and, when the calibration mirror is in the deployed position, to rotate the calibration mirror about a second axis into a plurality of calibration positions, the first and second axes being orthogonal.
(FR) L'invention concerne des dispositifs, des systèmes et des procédés d'étalonnage permettant d'étalonner un capteur. Dans un exemple, un appareil d'étalonnage comprend un boîtier, un mécanisme de positionnement de miroir à deux axes disposé à l'intérieur du boîtier, et un seul miroir d'étalonnage couplé au mécanisme de positionnement de miroir à deux axes et disposé à l'intérieur du boîtier, le mécanisme de positionnement de miroir à deux axes étant conçu pour faire tourner le miroir d'étalonnage autour d'un premier axe afin de déplacer le miroir d'étalonnage d'une position rangée à une position déployée et, lorsque le miroir d'étalonnage est dans la position déployée, pour faire tourner le miroir d'étalonnage autour d'un second axe dans une pluralité de positions d'étalonnage, les premier et second axes étant orthogonaux.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)