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1. (WO2018044030) OPTICAL CHARACTERISTIC INSPECTOR AND OPTICAL CHARACTERISTIC INSPECTING METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/044030    International Application No.:    PCT/KR2017/009414
Publication Date: 08.03.2018 International Filing Date: 29.08.2017
IPC:
G01J 9/00 (2006.01), G02B 5/30 (2006.01)
Applicants: LG CHEM, LTD. [KR/KR]; 128, Yeoui-daero, Yeongdeungpo-gu, Seoul 07336 (KR)
Inventors: JO, Min Yeong; (KR).
PARK, Jin Yong; (KR).
PARK, Dong Min; (KR).
LEE, Won Chul; (KR).
JUNG, Ki Jun; (KR)
Agent: DANA PATENT LAW FIRM; 5th Floor, New Wing, Gwangsung Bldg., 11, Yeoksam-ro 3gil, Gangnam-gu, Seoul 06242 (KR)
Priority Data:
10-2016-0112917 02.09.2016 KR
Title (EN) OPTICAL CHARACTERISTIC INSPECTOR AND OPTICAL CHARACTERISTIC INSPECTING METHOD
(FR) DISPOSITIF D'INSPECTION DE CARACTÉRISTIQUES OPTIQUES ET PROCÉDÉ D'INSPECTION DE CARACTÉRISTIQUES OPTIQUES
(KO) 광학 특성 검사기 및 광학 특성 검사 방법
Abstract: front page image
(EN)The present application relates to an optical characteristic inspector and an optical characteristic inspecting method. The present application provides an optical characteristic inspector requiring low device manufacturing cost and low maintenance cost, enables a phase difference inspection in plain-wise in a wide range through the optical characteristic inspector, and can provide an optical characteristic inspecting method having an improved efficiency in identifying a phase-lag axis.
(FR)La présente invention concerne un dispositif d'inspection de caractéristiques optiques et un procédé d'inspection de caractéristiques optiques. La présente invention concerne un dispositif d'inspection de caractéristiques optiques nécessitant un faible coût de fabrication de dispositif et un faible coût de maintenance, permet d'inspecter la différence de phase en clair dans une large plage grâce à l'inspecteur de caractéristique optique, et peut fournir un procédé d'inspection de caractéristiques optiques ayant une efficacité améliorée dans l'identification d'un axe de retard de phase.
(KO)본 출원은 광학 특성 검사기 및 광학 특성 검사 방법에 관한 것으로, 본 출원의 광학 특성 검사기는, 장치 제작 및 유지비가 저렴하며, 상기 광학 특성 검사기를 통해 넓은 범위의 면 방향 위상차 검사가 가능하고, 위상지연 축 확인 효율이 향상된 광학 특성 검사 방법을 제공할 수 있다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)