Search International and National Patent Collections
|1. (WO2018043402) DEVICE FOR MEASURING THE QUALITY OF GRAINS|
|Applicants:||SHIZUOKA SEIKI CO., LTD.
|Title:||DEVICE FOR MEASURING THE QUALITY OF GRAINS|
Provided is a device for measuring the quality of grains which is capable of obtaining stable measurement results with ease, without being affected by the shape of the grains, by enabling the rotation speed of an impeller to be changed in accordance with the shape of the grains to be measured. The present invention is characterized by being provided with: a hopper which is provided to an upper part of a housing, and into which grains are introduced; an impeller which conveys the grains introduced into the hopper by rotating said grains; a sample measurement unit which is provided below the impeller, and which can be filled with a prescribed amount of grains; a measurement means which optically measures the quality of the grains in the sample measurement unit; and a control device which is capable of changing the rotation speed of the impeller in accordance with the shape of the grains introduced into the hopper.