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1. (WO2018042760) MEASURMENT METHOD, MEASUREMENT DEVICE, AND MEASUREMENT PROGRAM
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Pub. No.: WO/2018/042760 International Application No.: PCT/JP2017/017191
Publication Date: 08.03.2018 International Filing Date: 01.05.2017
IPC:
G01M 11/02 (2006.01) ,G01M 11/00 (2006.01) ,G02B 6/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11
Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
02
Testing of optical properties
G PHYSICS
01
MEASURING; TESTING
M
TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
11
Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
6
Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
Applicants:
株式会社フジクラ FUJIKURA LTD. [JP/JP]; 東京都江東区木場1丁目5番1号 1-5-1, Kiba, Koto-ku, Tokyo 1358512, JP
国立大学法人島根大学 NATIONAL UNIVERSITY CORPORATION SHIMANE UNIVERSITY [JP/JP]; 島根県松江市西川津町1060 1060, Nishikawatsu-cho, Matsue-shi, Shimane 6908504, JP
Inventors:
丸山 遼 MARUYAMA, Ryo; JP
桑木 伸夫 KUWAKI, Nobuo; JP
伊藤 文彦 ITO, Fumihiko; JP
Agent:
特許業務法人HARAKENZO WORLD PATENT & TRADEMARK HARAKENZO WORLD PATENT & TRADEMARK; 大阪府大阪市北区天神橋2丁目北2番6号 大和南森町ビル Daiwa Minamimorimachi Building, 2-6, Tenjinbashi 2-chome Kita, Kita-ku, Osaka-shi, Osaka 5300041, JP
Priority Data:
2016-17029731.08.2016JP
Title (EN) MEASURMENT METHOD, MEASUREMENT DEVICE, AND MEASUREMENT PROGRAM
(FR) PROCÉDÉ DE MESURE, DISPOSITIF DE MESURE, ET PROGRAMME DE MESURE
(JA) 測定方法、測定装置、及び測定プログラム
Abstract:
(EN) The present invention makes it possible to measure the effective refractive index difference between propagation modes at a specific point in a multimode optical fiber. In the present invention, a Brillouin frequency shift ν1 is measured on the basis of the frequency spectrum of scattered light generated when light of a first propagation mode is input (S12), a Brillouin frequency shift ν2 is measured on the basis of the frequency spectrum of scattered light generated when light of a second propagation mode is input (S14), and (ν1 − ν2) / (2kVL) is calculated as the effective refractive index difference (S15).
(FR) La présente invention permet de mesurer la différence d'indice de réfraction efficace entre des modes de propagation à un point spécifique dans une fibre optique multimode. Dans la présente invention, un décalage de fréquence de Brillouin v1 est mesuré sur la base du spectre de fréquence de la lumière diffusée générée lorsque la lumière d'un premier mode de propagation est entrée (S12), un décalage de fréquence de Brillouin v2 est mesuré sur la base du spectre de fréquence de la lumière diffusée générée lorsque la lumière d'un second mode de propagation est entrée (S14), et (ν1 − ν2) / (2kVL) est calculée en tant que différence d'indice de réfraction effective (S15).
(JA) マルチモードファイバの特定の点における伝搬モード間の実効屈折率差を測定する。マルチモードファイバに、第1の伝搬モードの光を入力した時に発生する散乱光の周波数スペクトルからブリルアン周波数シフトν1を測定し(S12)、第2の伝搬モードの光を入力した時に発生する散乱光の周波数スペクトルからブリルアン周波数シフトν2を測定し(S14)、実効屈折率差として(ν1-ν2)/(2kV)を算出する(S15)。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)