Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018042535) SAMPLE FOR PARTICLE MEASUREMENT, PARTICLE MEASUREMENT METHOD, AND PARTICLE MEASUREMENT DEVICE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/042535 International Application No.: PCT/JP2016/075443
Publication Date: 08.03.2018 International Filing Date: 31.08.2016
IPC:
G01B 15/00 (2006.01) ,G01N 15/02 (2006.01) ,G01N 15/06 (2006.01) ,G01N 23/225 (2006.01) ,G01Q 80/00 (2010.01)
G PHYSICS
01
MEASURING; TESTING
B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
15
Measuring arrangements characterised by the use of wave or particle radiation
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
02
Investigating particle size or size distribution
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
15
Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
06
Investigating concentration of particle suspensions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
22
by measuring secondary emission
225
using electron or ion microprobe
G PHYSICS
01
MEASURING; TESTING
Q
SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM]
80
Applications, other than SPM, of scanning-probe techniques
Applicants:
株式会社日立ハイテクノロジーズ HITACHI HIGH-TECHNOLOGIES CORPORATION [JP/JP]; 東京都港区西新橋一丁目24番14号 24-14, Nishi Shimbashi 1-chome, Minato-ku, Tokyo 1058717, JP
Inventors:
橋詰 富博 HASHIZUME Tomihiro; JP
安武 正敏 YASUTAKE Masatoshi; JP
永田 真斗 NAGATA Sanato; JP
Agent:
ポレール特許業務法人 POLAIRE I.P.C.; 東京都中央区日本橋茅場町二丁目13番11号 13-11, Nihonbashikayabacho 2-chome, Chuo-ku, Tokyo 1030025, JP
Priority Data:
Title (EN) SAMPLE FOR PARTICLE MEASUREMENT, PARTICLE MEASUREMENT METHOD, AND PARTICLE MEASUREMENT DEVICE
(FR) ÉCHANTILLON POUR MESURE DE PARTICULE, PROCÉDÉ DE MESURE DE PARTICULE ET DISPOSITIF DE MESURE DE PARTICULE
(JA) 粒子計測用試料、粒子計測方法および粒子計測装置
Abstract:
(EN) To provide a sample for particle measurement that makes it possible to evaluate the three-dimensional shape and fine particle type of a fine particle, a sample for particle measurement is provided with a substrate, an isolated fine particle to be measured (144-1) that is disposed on the substrate, and an isolated standard fine particle (143-1) that is disposed on the substrate in the vicinity of the isolated fine particle to be measured.
(FR) Afin de fournir un échantillon pour mesure de particule qui permet d'évaluer la forme tridimensionnelle et le type de particule fine d'une particule fine, un échantillon pour mesure de particule est pourvu d'un substrat, d'une particule fine isolée à mesurer (144-1) qui est disposée sur le substrat, et d'une particule fine standard isolée (143-1) qui est disposée sur le substrat à proximité de la particule fine isolée à mesurer.
(JA) 微粒子の三次元形状や微粒子種の評価が可能な粒子計測用試料を提供するために、基板と、基板の上に配置された孤立被測定微粒子(144-1)と、基板の上であって、孤立被測定微粒子の近傍に配置された孤立標準微粒子(143-1)と、を有する粒子計測用試料とする。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KR, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)