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1. (WO2018038413) SPECTROMETER AND SPECTRUM MEASUREMENT METHOD UTILIZING SAME
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/038413 International Application No.: PCT/KR2017/008256
Publication Date: 01.03.2018 International Filing Date: 31.07.2017
IPC:
G01J 3/08 (2006.01) ,G01N 21/359 (2014.01) ,G02B 6/293 (2006.01) ,G01N 21/35 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
02
Details
08
Beam-switching arrangements
[IPC code unknown for G01N 21/359]
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
6
Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
24
Coupling light guides
26
Optical coupling means
28
having data bus means, i.e. plural waveguides interconnected and providing an inherently bidirectional system by mixing and splitting signals
293
with wavelength selective means
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
35
using infra-red light
Applicants:
삼성전자 주식회사 SAMSUNG ELECTRONICS CO., LTD. [KR/KR]; 경기도 수원시 영통구 삼성로 129 129, Samsung-ro, Yeongtong-gu Suwon-si Gyeonggi-do 16677, KR
Inventors:
이경석 LEE, Kyeong Seok; KR
김원목 KIM, Won Mok; KR
황규원 HWANG, Gyu Weon; KR
김인호 KIM, In Ho; KR
이욱성 LEE, Wook Seong; KR
정두석 JEONG, Doo Seok; KR
Agent:
특허법인 고려 KORYO IP&LAW; 서울특별시 강남구 테헤란로 8길 41, 6층 6F, 41, Teheran-ro 8-gil Gangnam-gu Seoul 06239, KR
Priority Data:
10-2016-010642222.08.2016KR
10-2017-005389426.04.2017KR
Title (EN) SPECTROMETER AND SPECTRUM MEASUREMENT METHOD UTILIZING SAME
(FR) SPECTROMÈTRE ET PROCÉDÉ DE MESURE DE SPECTRE L'UTILISANT
(KO) 분광기 및 이를 이용한 스펙트럼 측정방법
Abstract:
(EN) Disclosed is a spectrometer provided with: a first unit spectral filter for absorbing or reflecting the incoming light of a partial wavelength band of the light spectrum of a target object; a second unit spectral filter for absorbing or reflecting the light of a wavelength band different from the partial wavelength band; a first light detector for detecting a first light spectrum passing through the first unit spectral filter; a second light detector for detecting a second light spectrum passing through the second unit spectral filter; and a processing unit for executing the function of reconstructing the entered light spectrum of the target object from the spectrum of light detected from the first light detector and second light detector.
(FR) La présente invention concerne un spectromètre équipé : d'un premier filtre spectral d'unité permettant d'absorber ou de réfléchir la lumière entrante d'une bande de longueur d'onde partielle du spectre de lumière d'un objet cible; d'un second filtre spectral d'unité permettant d'absorber ou de réfléchir la lumière d'une bande de longueur d'onde différente de la bande de longueur d'onde partielle; d'un premier détecteur de lumière permettant de détecter un premier spectre de lumière traversant le premier filtre spectral d'unité; d'un second détecteur de lumière permettant de détecter un second spectre de lumière traversant le second filtre spectral d'unité; et d'une unité de traitement permettant d'exécuter la fonction de reconstruction du spectre de lumière entré de l'objet cible à partir du spectre de lumière détecté depuis le premier détecteur de lumière et le second détecteur de lumière.
(KO) 본 발명은 입사되는 대상체의 광스펙트럼의 일부 파장대역의 광을 광흡수하거나 광반사하는 제1 단위분광필터와, 상기 일부 파장대역과 다른 파장대역의 광을 광흡수하거나 광반사하는 제2단위분광필터와, 상기 제 1단위분광필터를 투과하는 제1 광스펙트럼을 검출하기 위한 제 1광검출기와, 상기 제 2단위분광필터를 투과하는 제2 광스펙트럼을 검출하기 위한 제 2광검출기와, 상기 제 1광검출기 및 제 2광검출기로부터 검출된 광의 스펙트럼으로부터 입사한 상기 대상체의 광 스펙트럼을 재구성하는 기능을 수행하는 프로세싱 유닛을 구비하는 분광기를 개시한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)