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1. (WO2018038262) MEASUREMENT DEVICE, MEASUREMENT METHOD AND PROGRAM
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Pub. No.: WO/2018/038262 International Application No.: PCT/JP2017/030588
Publication Date: 01.03.2018 International Filing Date: 25.08.2017
IPC:
G01S 17/89 (2006.01) ,G01S 13/93 (2006.01) ,G01S 17/93 (2006.01)
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17
Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
88
Lidar systems, specially adapted for specific applications
89
for mapping or imaging
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
13
Systems using the reflection or reradiation of radio waves, e.g. radar systems; Analogous systems using reflection or reradiation of waves whose nature or wavelength is irrelevant or unspecified
88
Radar or analogous systems, specially adapted for specific applications
93
for anti-collision purposes
G PHYSICS
01
MEASURING; TESTING
S
RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
17
Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
88
Lidar systems, specially adapted for specific applications
93
for anti-collision purposes
Applicants:
パイオニア株式会社 PIONEER CORPORATION [JP/JP]; 東京都文京区本駒込二丁目28番8号 28-8, Honkomagome 2-chome, Bunkyo-ku, Tokyo 1130021, JP
Inventors:
松田 武浩 MATSUDA Takehiro; JP
宮鍋 庄悟 MIYANABE Shogo; JP
Agent:
速水 進治 HAYAMI Shinji; JP
天城 聡 AMAGI Satoshi; JP
Priority Data:
2016-16581826.08.2016JP
Title (EN) MEASUREMENT DEVICE, MEASUREMENT METHOD AND PROGRAM
(FR) DISPOSITIF DE MESURE, PROCÉDÉ DE MESURE ET PROGRAMME
(JA) 計測装置、計測方法及びプログラム
Abstract:
(EN) This measurement device (200) is provided with a measurement unit (202) which emits electromagnetic waves and which scans a target with the electromagnetic waves to perform a measurement, and a control unit (204) which controls the measurement unit (202). The measurement unit (202) can operate in a first scan mode, in which a target is scanned in a first direction, or a second scan mode, in which the target is scanned in a second direction different from the first direction. The control unit (204) determines the scan mode to be carried out by the measurement unit (202).
(FR) L'invention concerne un dispositif de mesure (200) pourvu d'une unité de mesure (202) qui émet des ondes électromagnétiques et qui balaie une cible au moyen des ondes électromagnétiques pour effectuer une mesure, et d'une unité de commande (204) qui commande l'unité de mesure (202). L'unité de mesure (202) peut fonctionner dans un premier mode de balayage, dans lequel une cible est balayée dans une première direction, ou dans un second mode de balayage, dans lequel la cible est balayée dans une seconde direction différente de la première direction. L'unité de commande (204) détermine le mode de balayage que l'unité de mesure (202) doit effectuer.
(JA) 計測装置(200)は、電磁波を出射し、当該電磁波によって対象物を走査して計測を行う計測部(202)と、計測部(202)を制御する制御部(204)と、を有する。計測部(202)は、対象物を第1の方向に沿って走査する第1の走査モード、又は、第1の方向とは異なる第2の方向に沿って走査する第2の走査モードで動作可能である。制御部(204)は、計測部(202)が実行する走査モードを決定する。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)