WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Options
Query Language
Stem
Sort by:
List Length
Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2018038251) FOREIGN MATTER INSPECTING DEVICE, FOREIGN MATTER INSPECTING METHOD, FOREIGN MATTER CONTAMINATION INSPECTING SYSTEM, AND FOREIGN MATTER CONTAMINATION INSPECTING METHOD
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/038251 International Application No.: PCT/JP2017/030494
Publication Date: 01.03.2018 International Filing Date: 25.08.2017
IPC:
G01N 21/88 (2006.01) ,G01N 21/64 (2006.01) ,G01N 21/85 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
85
Investigating moving fluids or granular solids
Applicants: MITSUI KINZOKU INSTRUMENTATIONS TECHNOLOGY CORPORATION[JP/JP]; 2-88, Kokihigashi, Komaki-shi, Aichi 4850059, JP
DIC CORPORATION[JP/JP]; 35-58, Sakashita 3-chome, Itabashi-ku, Tokyo 1748520, JP
Inventors: HAYASE Hiroshi; JP
SAKURAI Naoto; JP
Agent: SSINPAT PATENT FIRM; Gotanda Yamazaki Bldg. 6F, 13-6, Nishigotanda 7-chome, Shinagawa-ku, Tokyo 1410031, JP
Priority Data:
2016-16587226.08.2016JP
Title (EN) FOREIGN MATTER INSPECTING DEVICE, FOREIGN MATTER INSPECTING METHOD, FOREIGN MATTER CONTAMINATION INSPECTING SYSTEM, AND FOREIGN MATTER CONTAMINATION INSPECTING METHOD
(FR) DISPOSITIF D'INSPECTION DE MATIÈRE ÉTRANGÈRE, PROCÉDÉ D'INSPECTION DE MATIÈRE ÉTRANGÈRE, SYSTÈME D'INSPECTION DE CONTAMINATION PAR MATIÈRE ÉTRANGÈRE ET PROCÉDÉ D'INSPECTION DE CONTAMINATION PAR MATIÈRE ÉTRANGÈRE
(JA) 異物検査装置及び異物検査方法並びに異物混入検査システム及び異物混入検査方法
Abstract:
(EN) [Problem] To provide a foreign matter inspecting device, a foreign matter inspecting method, a foreign matter contamination inspecting system, and a foreign matter contamination inspecting method, with which it is possible to improve the accuracy of detection of foreign matter, and to prevent an object to be inspected, such as a food product, being distributed in a state of contamination with foreign matter resulting from a resin member such as cleaning brush, a cleaning duster (cloth), or rubber gloves worn by an operator. [Solution] Illuminating light including at least a wavelength that excites near infrared emitting pigment contained in foreign matter is radiated onto an object to be inspected, light emission information based on near infrared emitted light that is emitted when the near infrared emitting pigment is excited is acquired, and the presence or absence of foreign matter is assessed on the basis of the light emission information.
(FR) Le problème décrit par la présente invention est de fournir un dispositif d'inspection de matière étrangère, un procédé d'inspection de matière étrangère, un système d'inspection de contamination par matière étrangère, et un procédé d'inspection de contamination par matière étrangère, grâce auxquels il est possible d'améliorer la précision de détection de matière étrangère, et d'empêcher un objet à inspecter, tel qu'un produit alimentaire, d'être distribué à l'état contaminé par une matière étrangère résultant d'un élément en résine tel qu'une brosse de nettoyage, un chiffon de nettoyage (tissu) ou des gants en caoutchouc portés par un opérateur. La solution selon l'invention porte sur une lumière d'éclairage comportant au moins une longueur d'onde qui excite un pigment émettant dans le proche infrarouge compris dans une matière étrangère rayonnée sur un objet à inspecter, des informations d'émission de lumière fondées sur la lumière émise dans le proche infrarouge qui est émise lorsque le pigment émettant dans le proche infrarouge est excité sont acquises, et la présence ou l'absence de matière étrangère est évaluée sur la base des informations d'émission de lumière.
(JA) [課題]異物の検出精度を向上させ、食品などの被検査物品に、清掃用ブラシや清掃用ダスター(ふきん)、作業者が装着するゴム手袋などの樹脂部材に起因する異物が混入した状態で流通することを防ぐことができる異物検査装置及び異物検査方法並びに異物混入検査システム及び異物混入検査方法を提供する。 [解決手段]被検査物品に対して、異物に含まれる近赤外発光色素の励起波長を少なくとも含む照明光を照射するとともに、近赤外発光色素が励起して発光する近赤外発光に基づく発光情報を取得し、該発光情報に基づき、異物の有無を判定する。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)