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1. WO2018037463 - CAPACITANCE DETECTION DEVICE AND OPTICAL WAVELENGTH-SELECTIVE FILTER DEVICE

Publication Number WO/2018/037463
Publication Date 01.03.2018
International Application No. PCT/JP2016/074410
International Filing Date 22.08.2016
IPC
G01R 27/26 2006.1
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants
CPC
G01R 27/26
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; ; Measuring impedance or related variables
G01R 27/2605
GPHYSICS
01MEASURING; TESTING
RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
27Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; ; Measuring impedance or related variables
2605Measuring capacitance
G02B 5/284
GPHYSICS
02OPTICS
BOPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5Optical elements other than lenses
20Filters
28Interference filters
284of etalon type comprising a resonant cavity other than a thin solid film, e.g. gas, air, solid plates
Applicants
  • パイオニア株式会社 PIONEER CORPORATION [JP]/[JP]
Inventors
  • 奥田 義行 OKUDA, Yoshiyuki
Agents
  • 江上 達夫 EGAMI, Tatsuo
  • 中村 聡延 NAKAMURA, Toshinobu
Priority Data
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) CAPACITANCE DETECTION DEVICE AND OPTICAL WAVELENGTH-SELECTIVE FILTER DEVICE
(FR) DISPOSITIF DE DÉTECTION DE CAPACITÉ ET DISPOSITIF DE FILTRE SÉLECTIF EN LONGUEUR D'ONDE OPTIQUE
(JA) 静電容量検出装置及び光波長選択フィルタ装置
Abstract
(EN)
Provided is a capacitance detection device comprising: a parallel circuit in which a first series circuit, formed of a test device (Cx) and a first resistor element (R1) that are connected by a first node, is connected in parallel to a second series circuit, formed of a reference capacitance element (Cref) and a second resistor element (R2) that are connected by a second node; a power supply circuit for applying an alternating-current voltage (Vi) of a specific frequency to the parallel circuit; an inductance element (Lb) connected between the first node and second node for enlarging a phase difference of a voltage of a specific frequency generated between the nodes; and an output unit (100) for outputting, on the basis of the phase difference, an electrical signal in accordance with the capacitance of the test device. The capacitance detection device makes it possible to suitably detect the capacitance of the test device.
(FR)
L'invention concerne un dispositif de détection de capacité comprenant : un circuit parallèle dans lequel un premier circuit série, formé d'un dispositif de test (Cx) et d'un premier élément de résistance (R1) qui sont connectés par un premier nœud, sont connectés en parallèle à un second circuit série, formé d'un élément capacitif de référence (Cref) et d'un second élément de résistance (R2) qui sont connectés par un second nœud ; un circuit d'alimentation électrique permettant d'appliquer une tension de courant alternatif (Vi) d'une fréquence spécifique au circuit parallèle ; un élément d'inductance (Lb) connecté entre le premier nœud et le second nœud permettant d'agrandir une différence de phase d'une tension d'une fréquence spécifique générée entre les nœuds ; et une unité de sortie (100) permettant de délivrer, sur la base de la différence de phase, un signal électrique en fonction de la capacité du dispositif de test. Le dispositif de détection de capacité permet de détecter de manière appropriée la capacité du dispositif de test.
(JA)
静電容量検出装置は、被検体(Cx)と第1抵抗要素(R1)とが第1ノードで接続されてなる第1直列回路、及び基準静電容量要素(Cref)と第2抵抗要素(R2)とが第2ノードで接続されてなる第2直列回路が並列接続された並列回路と、並列回路に特定周波数の交流電圧(Vi)を印加する電源回路と、第1ノード及び第2ノード間に接続され、当該ノード間に生じる特定周波数の電圧の位相差を拡大するインダクタ要素(Lb)と、位相差に基づいて被検体の静電容量に応じた電気信号を出力する出力部(100)とを備える。この静電容量検出装置によれば、被検体の静電容量を好適に検出することが可能である。
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