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1. (WO2018035401) MICROWAVE REFLECTOMETRY FOR PHYSICAL INSPECTIONS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/035401 International Application No.: PCT/US2017/047489
Publication Date: 22.02.2018 International Filing Date: 18.08.2017
IPC:
G01N 21/3581 (2014.01) ,G01N 21/17 (2006.01) ,G01N 21/31 (2006.01) ,G01N 21/3563 (2014.01) ,G01N 21/3586 (2014.01) ,G01N 21/84 (2006.01)
[IPC code unknown for G01N 21/3581]
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
25
Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
31
Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
[IPC code unknown for G01N 21/3563][IPC code unknown for G01N 21/3586]
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
Applicants: THE CURATORS OF THE UNIVERSITY OF MISSOURI[US/US]; 316 University Hall Columbia, Missouri 65211, US
Inventors: GHASR, Mohammad Tayeb; US
ZOUGHI, Reza; US
SHINDE, Satyajeet; US
JOTHIBASU, Sasi; US
Agent: BAIN, Robert M.; US
AGOVINO, Frank R.; US
CONWAY, Jason H.; US
EVANS, Robert M., Jr.; US
EVERDING, William R.; US
BARRINGER, Kyle L.; US
GODAR, Michael E.; US
HARTLEY, Michael J.; US
HENDRICKSON, Janet S.; US
JAMES, Kurt F.; US
JORDAN, Jamaal R.; US
KEIL, Vincent M.; US
MILLARD, Elizabeth E.; US
PETRILLO, Kathleen M.; US
POLLMANN, Jonathan G.; US
FLEISCHUT, Paul I.J.; US
ROEDEL, John K., Jr.; US
JOHNSON, Morgan L.; US
SCHROEDER, John R.; US
SURI, Aleksandra; US
TIETZ, Paul D.; US
VANDER TUIG, Marc W.; US
WALTERS, N. Christopher; US
WEGMAN, Andrew C.; US
Priority Data:
62/377,38719.08.2016US
Title (EN) MICROWAVE REFLECTOMETRY FOR PHYSICAL INSPECTIONS
(FR) RÉFLECTOMÉTRIE À MICRO-ONDES POUR INSPECTIONS PHYSIQUES
Abstract:
(EN) Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
(FR) La présente invention concerne l’utilisation de réflexions de micro-ondes pour comparer un dispositif de référence à des dispositifs de contrefaçon et/ou vieillissants à l’essai. La réflexion du dispositif à l’essai varie sur la base de certaines propriétés, ce qui conduit à ce qui chaque dispositif ait une signature électromagnétique unique et intrinsèque. Des comparaisons de la signature électromagnétique du dispositif à l’essai à la signature électromagnétique d’un dispositif de référence permettent d’évaluer l’acceptabilité du dispositif à l’essai.
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)