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1. (WO2018035401) MICROWAVE REFLECTOMETRY FOR PHYSICAL INSPECTIONS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2018/035401    International Application No.:    PCT/US2017/047489
Publication Date: 22.02.2018 International Filing Date: 18.08.2017
IPC:
G01N 21/3581 (2014.01), G01N 21/17 (2006.01), G01N 21/31 (2006.01), G01N 21/3563 (2014.01), G01N 21/3586 (2014.01), G01N 21/84 (2006.01)
Applicants: THE CURATORS OF THE UNIVERSITY OF MISSOURI [US/US]; 316 University Hall Columbia, Missouri 65211 (US)
Inventors: GHASR, Mohammad Tayeb; (US).
ZOUGHI, Reza; (US).
SHINDE, Satyajeet; (US).
JOTHIBASU, Sasi; (US)
Agent: BAIN, Robert M.; (US).
AGOVINO, Frank R.; (US).
CONWAY, Jason H.; (US).
EVANS, Robert M., Jr.; (US).
EVERDING, William R.; (US).
BARRINGER, Kyle L.; (US).
GODAR, Michael E.; (US).
HARTLEY, Michael J.; (US).
HENDRICKSON, Janet S.; (US).
JAMES, Kurt F.; (US).
JORDAN, Jamaal R.; (US).
KEIL, Vincent M.; (US).
MILLARD, Elizabeth E.; (US).
PETRILLO, Kathleen M.; (US).
POLLMANN, Jonathan G.; (US).
FLEISCHUT, Paul I.J.; (US).
ROEDEL, John K., Jr.; (US).
JOHNSON, Morgan L.; (US).
SCHROEDER, John R.; (US).
SURI, Aleksandra; (US).
TIETZ, Paul D.; (US).
VANDER TUIG, Marc W.; (US).
WALTERS, N. Christopher; (US).
WEGMAN, Andrew C.; (US)
Priority Data:
62/377,387 19.08.2016 US
Title (EN) MICROWAVE REFLECTOMETRY FOR PHYSICAL INSPECTIONS
(FR) RÉFLECTOMÉTRIE À MICRO-ONDES POUR INSPECTIONS PHYSIQUES
Abstract: front page image
(EN)Utilizing microwave reflections to compare a reference device with counterfeit and/or aging devices under test. The reflection from the device under test varies based on certain properties, which results in each device having a unique and intrinsic electromagnetic signature. Comparisons of the electromagnetic signature of the device under test to the electromagnetic signature of a reference device enable evaluating the acceptability of the device under test.
(FR)La présente invention concerne l’utilisation de réflexions de micro-ondes pour comparer un dispositif de référence à des dispositifs de contrefaçon et/ou vieillissants à l’essai. La réflexion du dispositif à l’essai varie sur la base de certaines propriétés, ce qui conduit à ce qui chaque dispositif ait une signature électromagnétique unique et intrinsèque. Des comparaisons de la signature électromagnétique du dispositif à l’essai à la signature électromagnétique d’un dispositif de référence permettent d’évaluer l’acceptabilité du dispositif à l’essai.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: English (EN)
Filing Language: English (EN)