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1. (WO2018034654) ROUNDED METAL TRACE CORNER FOR STRESS REDUCTION

Pub. No.:    WO/2018/034654    International Application No.:    PCT/US2016/047216
Publication Date: Fri Feb 23 00:59:59 CET 2018 International Filing Date: Wed Aug 17 01:59:59 CEST 2016
IPC: H01L 23/538
H01L 23/00
H01L 25/065
Applicants: INTEL CORPORATION
Inventors: KIM, Dae-Woo
JAIN, Ajay
PATEL, Neha M.
HENDRICKS, Rodrick J.
SHARAN, Sujit
Title: ROUNDED METAL TRACE CORNER FOR STRESS REDUCTION
Abstract:
An integrated circuit package is disclosed. The integrated circuit package comprises a first integrated circuit die and a second integrated circuit die. The integrated circuit package further includes a substrate, wherein both the first integrated circuit die and the second integrated circuit die are connected to the substrate. The substrate includes an interconnect bridge embedded within the substrate, wherein the interconnect bridge includes at least one metal trace component, wherein the metal trace component includes rounded corners on a bottom portion of the metal trace component.