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1. WO2018034095 - AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME

Publication Number WO/2018/034095
Publication Date 22.02.2018
International Application No. PCT/JP2017/025815
International Filing Date 14.07.2017
IPC
G01N 35/02 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
G01N 35/04 2006.1
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
CPC
G01N 2035/0406
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
0401Sample carriers, cuvettes or reaction vessels
0406Individual bottles or tubes
G01N 2035/0424
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
0401Sample carriers, cuvettes or reaction vessels
0418Plate elements with several rows of samples
0422carried on a linear conveyor
0424Two or more linear conveyors
G01N 2035/0462
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
046General conveyor features
0462Buffers [FIFO] or stacks [LIFO] for holding carriers between operations
G01N 2035/0472
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
04Details of the conveyor system
046General conveyor features
0467Switching points ("aiguillages")
0472for selective recirculation of carriers
G01N 35/00584
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
00584Control arrangements for automatic analysers
G01N 35/02
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
02using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
Applicants
  • 株式会社日立ハイテクノロジーズ HITACHI HIGH-TECHNOLOGIES CORPORATION [JP]/[JP]
Inventors
  • 松家 健史 MATSUKA Takeshi
  • 矢野 茂 YANO Shigeru
  • 近久 真章 CHIKAHISA Masaki
Agents
  • 特許業務法人開知国際特許事務所 KAICHI IP
Priority Data
2016-16088718.08.2016JP
Publication Language Japanese (JA)
Filing Language Japanese (JA)
Designated States
Title
(EN) AUTOMATED SAMPLE INSPECTION SYSTEM AND METHOD FOR CONTROLLING SAME
(FR) SYSTÈME D'INSPECTION D'ÉCHANTILLON AUTOMATISÉ ET PROCÉDÉ DE COMMANDE DUDIT SYSTÈME D'INSPECTION D'ÉCHANTILLON AUTOMATISÉ
(JA) 検体検査自動化システムおよびその制御方法
Abstract
(EN)
The automated sample inspection system is provided with: a conveyance line 201 for conveying sample carriers 100; an empty sample carrier line 202 for conveying empty sample carriers 100; and a buffer line 203 for temporarily holding empty sample carriers 100 supplied from the empty sample carrier line 202 to the conveyance line 201. According to the depletion status of the buffer line 203 of each processing system, and the depletion status of other processing systems adjacent to each processing system, the number of empty sample carriers 100 to be conveyed from the empty sample carrier line 202 to the buffer line 203 of each processing system, and the number of empty sample carriers 100 to be conveyed from the empty sample carrier line 202 of each processing system to the empty sample carrier line 202 of another adjacent processing system are determined. In doing so, delays in the processes in the system can be suppressed due to the suppression of the depletion of sample carriers.
(FR)
La présente invention concerne un système d'inspection d'échantillon automatisé comprenant : une ligne de transport (201) permettant de transporter des supports d'échantillon (100) ; une ligne de supports d'échantillon vides (202) permettant de transporter des supports d'échantillon vides (100) ; et une ligne tampon (203) permettant de maintenir temporairement des supports d'échantillon vides (100) alimentés par la ligne de supports d'échantillon vides (202) à la ligne de transport (201). Selon l'état d'épuisement de la ligne tampon (203) de chaque système de traitement, et l'état d'épuisement d'autres systèmes de traitement adjacents à chaque système de traitement, le nombre de supports d'échantillons vides (100) à transporter de la ligne de supports d'échantillons vides (202) à la ligne tampon (203) de chaque système de traitement, et le nombre de supports d'échantillons vides (100) à transporter de la ligne de supports d'échantillon vides (202) de chaque système de traitement à la ligne de supports d'échantillon vides (202) d'un autre système de traitement adjacent sont déterminés. Par ce moyen, les retards dans les processus dans le système peuvent être supprimés en raison de la suppression de l'épuisement des supports d'échantillons.
(JA)
検体キャリア100を搬送する搬送ライン201と、空の検体キャリア100を搬送する空検体キャリアライン202と、空検体キャリアライン202から搬送ライン201に供給される空の検体キャリア100を一時的に保持するバッファライン203とを備え、各処理システムのバッファライン203の枯渇状況、及び、各処理システムに隣接する他の処理システムの枯渇状況に応じて、各処理システムの空検体キャリアライン202からバッファライン203に搬送する空の検体キャリア100の数、及び、各処理システムの空検体キャリアライン202から隣接する他の処理システムの空検体キャリアライン202に搬送する空の検体キャリア100の数を決定する。これにより、検体キャリアの枯渇を抑制することによってシステム内における各処理の停滞を抑制することができる。
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