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1. (WO2018030603) METHOD AND DEVICE FOR INSPECTING FOR DEFECTS IN OPTICAL FILM
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/030603 International Application No.: PCT/KR2017/001899
Publication Date: 15.02.2018 International Filing Date: 21.02.2017
IPC:
G01N 21/88 (2006.01) ,G01N 35/00 (2006.01) ,G02B 5/30 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5
Optical elements other than lenses
30
Polarising elements
Applicants: DONGWOO FINE-CHEM CO., LTD.[KR/KR]; 132, Yakchon-ro Iksan-si, Jeollabuk-do 54631, KR
Inventors: LEE, Eun Gyu; KR
KIM, Jong Woo; KR
KIM, Jin Ho; KR
Agent: DARAE IP FIRM; (Handok Tower, Yeoksam-dong) 10th Fl., 132, Teheran-ro Gangnam-gu, Seoul 06235, KR
Priority Data:
10-2016-010047608.08.2016KR
Title (EN) METHOD AND DEVICE FOR INSPECTING FOR DEFECTS IN OPTICAL FILM
(FR) PROCÉDÉ ET DISPOSITIF D'INSPECTION DE DÉFAUTS DANS UN FILM OPTIQUE
(KO) 광학 필름의 결함 검사 방법 및 장치
Abstract:
(EN) A device for inspecting for defects in an optical film, according to the present invention, comprises the steps of: adhering the optical film to a first plate; emitting light at one surface of the optical film so as to acquire a first surface image; adhering the one surface of the optical film to a second plate and detaching the first plate; rotating the second plate, to which the one surface of the optical film is adhered, such that the other surface of the optical film faces the light emission direction; emitting light at the other surface of the optical film so as to acquire a second surface image; and detecting a defect by using the first surface image and the second surface image.
(FR) L'invention concerne un dispositif et un procédé permettant d'inspecter les défauts présents dans un film optique, ledit procédé comprenant les étapes consistant à faire adhérer le film optique à une première plaque ; émettre de la lumière sur une surface du film optique de façon à acquérir une première image superficielle ; faire adhérer ladite surface du film optique à une seconde plaque et détacher la première plaque ; faire tourner la seconde plaque à laquelle ladite surface du film optique est collée, de telle sorte que la seconde surface du film optique se trouve face à la direction de l'émission lumineuse ; émettre de la lumière sur la seconde surface du film optique de façon à acquérir une seconde image superficielle ; et détecter la présence d'un défaut en utilisant la première image superficielle et la seconde image superficielle.
(KO) 본 발명에 따른 광학 필름의 결함 검사 장치는 광학 필름을 제1 플레이트에 흡착시키는 단계; 상기 광학 필름의 일면에 광을 조사하여 제1 표면 이미지를 획득하는 단계; 상기 광학 필름의 일면을 제2 플레이트에 흡착시키고, 상기 제1 플레이트를 탈착시키는 단계; 상기 광학 필름의 일면이 흡착된 상기 제2 플레이트를, 상기 광학 필름의 타면이 상기 광 조사 방향을 향하도록 회전시키는 단계; 상기 광학 필름의 타면에 광을 조사하여 제2 표면 이미지를 획득하는 단계; 및 상기 제1 표면 이미지 및 상기 제2 표면 이미지로부터 결함을 검출하는 단계; 를 포함하는 것을 특징으로 한다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)