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1. (WO2018030247) NEAR-IR-CUT FILTER, SOLID STATE IMAGING DEVICE, CAMERA MODULE, AND IMAGE DISPLAY DEVICE
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Pub. No.: WO/2018/030247 International Application No.: PCT/JP2017/028153
Publication Date: 15.02.2018 International Filing Date: 03.08.2017
IPC:
G02B 5/22 (2006.01) ,G02B 5/28 (2006.01) ,G03B 11/00 (2006.01) ,G09F 9/00 (2006.01) ,H01L 27/146 (2006.01)
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5
Optical elements other than lenses
20
Filters
22
Absorbing filters
G PHYSICS
02
OPTICS
B
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS
5
Optical elements other than lenses
20
Filters
28
Interference filters
G PHYSICS
03
PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
B
APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR
11
Filters or other obturators specially adapted for photographic purposes
G PHYSICS
09
EDUCATING; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
F
DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
9
Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
H ELECTRICITY
01
BASIC ELECTRIC ELEMENTS
L
SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
27
Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
14
including semiconductor components sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
144
Devices controlled by radiation
146
Imager structures
Applicants: FUJIFILM CORPORATION[JP/JP]; 26-30, Nishiazabu 2-chome, Minato-ku, Tokyo 1068620, JP
Inventors: HITOMI Seiichi; JP
ARIMURA Keisuke; JP
KAWASHIMA Takashi; JP
OKAWARA Takahiro; JP
TSUYAMA Hiroaki; JP
Agent: SIKS & CO.; 8th Floor, Kyobashi-Nisshoku Bldg., 8-7, Kyobashi 1-chome, Chuo-ku, Tokyo 1040031, JP
Priority Data:
2016-15782110.08.2016JP
2017-00644618.01.2017JP
Title (EN) NEAR-IR-CUT FILTER, SOLID STATE IMAGING DEVICE, CAMERA MODULE, AND IMAGE DISPLAY DEVICE
(FR) FILTRE COUPURE PROCHE INFRAROUGE (IR), DISPOSITIF D'IMAGERIE À SEMI-CONDUCTEURS, MODULE DE CAMÉRA ET DISPOSITIF D'AFFICHAGE D'IMAGE
(JA) 近赤外線カットフィルタ、固体撮像素子、カメラモジュールおよび画像表示装置
Abstract:
(EN) Provided are a near-IR-cut filter which is excellent in visible transparency and IR shielding property and, when incorporated in a solid state imaging device, makes it possible to obtain an image in which purple fringes are suppressed; a solid state imaging device; a camera module; and an image display device. The near-IR-cut filter includes a copper complex and has the transmittance T450 of 85% or more, the ratio T350/T450, which is the ratio of the transmittance T350 and the transmittance T450, of 0-0.3, and the ratio T700/T550, which is the ratio of the transmittance T700 and the transmittance T550, of 0-0.2. The average value of the reflectance of the near-IR-cut filter is 80% or less in the range of 800-1000 nm.
(FR) L'invention concerne un filtre de coupure proche IR qui présente une excellente transparence visible et une excellente propriété de protection IR et, lorsqu'il est incorporé dans un dispositif d'imagerie à semi-conducteurs, permet d'obtenir une image dans laquelle des franges pourpre sont supprimées; un dispositif d'imagerie à semi-conducteurs; un module de caméra; et un dispositif d'affichage d'image. Le filtre de coupure proche IR comprend un complexe de cuivre et a la transmittance T 450 de 85 % ou plus, le rapport T 350 /T 450 , qui est le rapport de la transmittance T 350 et de la transmittance T 450 , de 0 à 0,3, et le rapport T 700 /T 550 , qui est le rapport du facteur de transmission T 700 et du facteur de transmission T 550 , de 0 à 0,2. La valeur moyenne de la réflectance du filtre de coupure proche IR est de 80 % ou moins dans la plage de 800 à 1000 nm.
(JA) 可視透明性および赤外線遮蔽性が良好で、かつ、固体撮像素子などに組み込んだ際に、パープルフリンジが抑制された画像を得ることが可能な近赤外線カットフィルタ、固体撮像素子、カメラモジュールおよび画像表示装置を提供する。銅錯体を含有する近赤外線カットフィルタであって、透過率T450が85%以上であり、透過率T350と透過率T450との比であるT350/T450が0~0.3であり、透過率T700と透過率T550との比であるT700/T550が0~0.2であり、波長800~1000nmの範囲において近赤外線カットフィルタの反射率の平均値が80%以下である。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)