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1. (WO2018030030) TOTALLY INTEGRATED ANALYSIS MODEL ASSISTANCE DEVICE

Pub. No.:    WO/2018/030030    International Application No.:    PCT/JP2017/024424
Publication Date: Fri Feb 16 00:59:59 CET 2018 International Filing Date: Wed Jul 05 01:59:59 CEST 2017
IPC: G06F 17/50
G06Q 10/04
G06Q 50/04
Applicants: HITACHI, LTD.
株式会社日立製作所
Inventors: NONAKA Norihiko
野中 紀彦
KAIHO Masayuki
海保 真行
Title: TOTALLY INTEGRATED ANALYSIS MODEL ASSISTANCE DEVICE
Abstract:
The purpose of the present invention is to improve analysis accuracy and reduce analysis time. A totally integrated analysis device for simultaneously estimating the performance and the manufacturing cost of a mechanical structure to be analyzed, said totally integrated analysis device comprising: a means for displaying an analysis process input screen, and also displaying an analysis process when an analysis node having an analysis program has been selected; a means for displaying an analysis condition input screen and also displaying input conditions needed for analysis; a means for creating an analysis model in accordance with the analysis process, then analyzing and estimating the performance of the mechanical structure, and analyzing and estimating the manufacturing cost on the basis of the performance estimation result; a means for acquiring past manufacturing cost information; a means for displaying a data analysis condition input screen and also displaying analysis conditions; a means for grouping the past manufacturing cost information by means of a clustering technique; a means for visualizing the results obtained by the grouping means, as a graph; and a means for acquiring and displaying analysis results.