Search International and National Patent Collections

1. (WO2018020999) X-RAY PHASE DIFFERENCE IMAGE CAPTURE DEVICE

Pub. No.:    WO/2018/020999    International Application No.:    PCT/JP2017/025143
Publication Date: Fri Feb 02 00:59:59 CET 2018 International Filing Date: Tue Jul 11 01:59:59 CEST 2017
IPC: A61B 6/00
G01N 23/04
Applicants: SHIMADZU CORPORATION
株式会社島津製作所
OSAKA UNIVERSITY
国立大学法人大阪大学
Inventors: SANO, Satoshi
佐野 哲
TANABE, Koichi
田邊 晃一
YOSHIMUTA, Toshinori
吉牟田 利典
KIMURA, Kenji
木村 健士
KISHIHARA, Hiroyuki
岸原 弘之
WADA, Yukihisa
和田 幸久
IZUMI, Takuro
和泉 拓朗
SHIRAI, Taro
白井 太郎
DOKI, Takahiro
土岐 貴弘
HORIBA, Akira
堀場 日明
SHIMURA, Takayoshi
志村 考功
WATANABE, Heiji
渡部 平司
HOSOI, Takuji
細井 卓治
Title: X-RAY PHASE DIFFERENCE IMAGE CAPTURE DEVICE
Abstract:
This x-ray phase difference image capture device (100) comprises: an x-ray source (1) which irradiates with continuous x-rays; a first lattice (3) for forming a self-image; a second lattice (4); a detection unit (5) which detects the continuous x-rays; and a third lattice (2) which is positioned between the detection unit (5) and the first lattice 3. The first lattice (3), the second lattice (4), and the third lattice (2) are positioned so as to satisfy the terms of a prescribed formula.