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1. (WO2018017715) SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/017715 International Application No.: PCT/US2017/042856
Publication Date: 25.01.2018 International Filing Date: 19.07.2017
IPC:
G01N 21/17 (2006.01) ,G01N 21/62 (2006.01) ,G01N 23/00 (2006.01) ,G01N 29/24 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23
Investigating or analysing materials by the use of wave or particle radiation not covered by group G01N21/ or G01N22/159
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
29
Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
22
Details
24
Probes
Applicants: BATTELLE MEMORIAL INSTITUTE[US/US]; P.O. Box 999, K1-53 Richland, Washington 99352, US
Inventors: KOVARIK, Libor; US
STEVENS, Andrew J.; US
LIYU, Andrey V.; US
BROWNING, Nigel D.; US
Agent: ETHAN A. MCGRATH; Klarquist Sparkman, LLP One World Trade Center, Suite 1600 121 SW Salmon Street Portland, OR 97204, US
Priority Data:
15/643,86207.07.2017US
62/364,17619.07.2016US
Title (EN) SPARSE SAMPLING METHODS AND PROBE SYSTEMS FOR ANALYTICAL INSTRUMENTS
(FR) PROCÉDÉS D’ÉCHANTILLONNAGE CLAIRSEMÉ ET SYSTÈMES DE SONDE DESTINÉS À DES INSTRUMENTS D’ANALYSE
Abstract:
(EN) Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.
(FR) La présente invention concerne des approches d’échantillonnage clairsemé et des systèmes de sonde pour des instruments d’analyse pour le sous-échantillonnage efficace d’un échantillon et la retouche en vue de reconstruire des représentations d’information réelle. Le sous-échantillonnage permet l’acquisition en série de valeurs mesurées contiguës reposant à des positions le long d’un trajet de balayage s’étendant sur une ligne vers un premier sens et présentant des perturbations aléatoires dans un second sens. Les perturbations sont limitées à l’intérieur d’une distance prédéterminée à partir de la ligne. Des techniques de retouche sont utilisées parmi les valeurs mesurées en vue de reconstruire une représentation d’information réelle concernant l’échantillon.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)