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1. (WO2018015972) EIGEN AUGMENTATION METHODS FOR ELECTROMAGNETIC MODELLING AND SIMULATION
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2018/015972 International Application No.: PCT/IN2017/050295
Publication Date: 25.01.2018 International Filing Date: 18.07.2017
IPC:
G06F 17/50 (2006.01)
Applicants: INDIAN INSTITUTE OF SCIENCE[IN/IN]; C V Raman Ave, Bangalore Karnataka Bangalore 560012, IN
ROBERT BOSCH ENGINEERING AND BUSINESS SOLUTIONS PRIVATE LIMITED[IN/IN]; No.123, Industrial Layout, Hosur Road, Koramangala, Bangalore, Karnataka Bangalore 560095, IN
Inventors: GOPE, Dipanjan; IN
CHATTERJEE, Gourav; IN
DAS, Arkaprovo; IN
VEDICHERLA, Sreenivasulu Reddy; IN
Agent: LAKSHMIKUMARAN, Malathi; IN
PHILLIPS, Prashant; IN
RAE, Konpal; IN
PANDEYA, Jaya; IN
SRINIVASAN, T.; IN
Priority Data:
20164102455518.07.2016IN
Title (EN) EIGEN AUGMENTATION METHODS FOR ELECTROMAGNETIC MODELLING AND SIMULATION
(FR) PROCÉDÉS D'EXTENSION D'ÉLÉMENTS PROPRES POUR LA MODÉLISATION ET LA SIMULATION ÉLECTROMAGNÉTIQUE
Abstract: front page image
(EN) Techniques for electromagnetic modelling of EM structures are described. Krylov subspace of a second EM structure (104, 504) is augmented with Eigen vectors of a first EM structure (102, 502) to form an augmented space. The second EM structure (104, 504) is a design variant of the first EM structure (102, 502) and the first EM structure (102, 502) is already EM modelled and simulated. Thereafter, Maxwell's equations for the second EM structure (104, 504) are solved using the augmented space.
(FR) L'invention concerne des techniques de modélisation électromagnétique de structures EM. Un sous-espace de Krylov d'une deuxième structure EM (104, 504) est étendu avec des vecteurs propres d'une première structure EM (102, 502) pour former un espace étendu. La deuxième structure EM (104, 504) est une variante de conception de la première structure EM (102, 502) et la première structure EM (102, 502) a déjà fait l'objet d'une modélisation et d'une simulation EM. Ensuite, les équations de Maxwell pour la deuxième structure EM (104, 504) sont résolues en utilisant l'espace étendu.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)