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1. (WO2018008576) INSPECTION EVALUATING DEVICE, INSPECTION EVALUATING METHOD AND PROGRAM
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Pub. No.: WO/2018/008576 International Application No.: PCT/JP2017/024290
Publication Date: 11.01.2018 International Filing Date: 03.07.2017
IPC:
G01N 21/84 (2006.01) ,A61B 3/113 (2006.01) ,G05B 19/418 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
A HUMAN NECESSITIES
61
MEDICAL OR VETERINARY SCIENCE; HYGIENE
B
DIAGNOSIS; SURGERY; IDENTIFICATION
3
Apparatus for testing the eyes; Instruments for examining the eyes
10
Objective types, i.e. instruments for examining the eyes independent of the patients perceptions or reactions
113
for determining or recording eye movement
G PHYSICS
05
CONTROLLING; REGULATING
B
CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
19
Programme-control systems
02
electric
418
Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control (DNC), flexible manufacturing systems (FMS), integrated manufacturing systems (IMS), computer integrated manufacturing (CIM)
Applicants:
日本電気株式会社 NEC CORPORATION [JP/JP]; 東京都港区芝五丁目7番1号 7-1, Shiba 5-chome, Minato-ku, Tokyo 1088001, JP
Inventors:
守谷 厚志 MORIYA, Atsushi; JP
Agent:
岡部 讓 OKABE, Yuzuru; JP
臼井 伸一 USUI, Shinichi; JP
越智 隆夫 OCHI, Takao; JP
吉澤 弘司 YOSHIZAWA, Hiroshi; JP
岡部 洋 OKABE, Yoh; JP
Priority Data:
2016-13316505.07.2016JP
Title (EN) INSPECTION EVALUATING DEVICE, INSPECTION EVALUATING METHOD AND PROGRAM
(FR) DISPOSITIF ET PROCÉDÉ D’ÉVALUATION D'INSPECTION, ET PROGRAMME ASSOCIÉ
(JA) 検査評価装置、検査評価方法およびプログラム
Abstract:
(EN) The objective of the present invention is to provide a technique with which the accuracy of evaluating a visual inspection can be improved in comparison with the prior art. An inspection evaluating device according to one mode of embodiment of the present invention is provided with: an inspection range setting unit for setting a range, which is an inspection target; a gaze direction detecting unit which detects a gaze direction of a subject performing an inspection of the inspection target; a face direction detecting unit which detects a face direction of the subject; and an evaluating unit which evaluates the inspection on the basis of the range, the face direction and the gaze direction.
(FR) L'objet de la présente invention est de pourvoir à une technique permettant d'améliorer la précision d'évaluation d'une inspection visuelle comparativement à l'état de la technique. Selon un mode de réalisation de la présente invention, le dispositif d'évaluation d'inspection comprend : une unité de définition d'une plage d'inspection destinée à définir une plage, qui est une cible d'inspection ; une unité de détection de direction du regard qui détecte la direction du regard du sujet procédant à l'inspection de la cible d'inspection ; une unité de détection de direction du visage qui détecte la direction du visage du sujet ; et une unité d'évaluation qui évalue l'inspection en fonction de la plage, de la direction du visage et de la direction du regard.
(JA) 本発明は、従来よりも目視検査の評価の精度を向上させる技術を提供する。本発明の一実施形態に係る検査評価装置は、検査対象である範囲を設定する検査範囲設定部と、検査対象の検査を行う対象者の視線方向を検出する視線方向検出部と、対象者の顔方向を検出する顔方向検出部と、範囲、顔方向および視線方向に基づいて、検査を評価する評価部と、を備える。
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)