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1. (WO2018007505) METHOD FOR AUTOMATED SURFACE EVALUATION
Latest bibliographic data on file with the International BureauSubmit observation

Pub. No.: WO/2018/007505 International Application No.: PCT/EP2017/066904
Publication Date: 11.01.2018 International Filing Date: 06.07.2017
IPC:
G01N 3/46 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
3
Investigating strength properties of solid materials by application of mechanical stress
40
Investigating hardness or rebound hardness
42
by performing impressions under a steady load by indentors, e.g. sphere, pyramid
46
the indentors performing a scratching movement
Applicants:
ANTON PAAR TRITEC SA [CH/CH]; Rue de la Gare 4 2034 Peseux, CH
Inventors:
COUDERT, Pierre-Jean; FR
RANDALL, Nicholas; CH
FAVARO, Gregory; CH
BELLATON, Bertrand; CH
Agent:
E-PATENT S.A.; Saint-Honoré 1 Case postale 2510 2001 Neuchâtel, CH
Priority Data:
16178537.308.07.2016EP
Title (EN) METHOD FOR AUTOMATED SURFACE EVALUATION
(FR) PROCÉDÉ POUR ÉVALUATION DE SURFACE AUTOMATIQUE
Abstract:
(EN) Method of evaluating a performance of a surface of a material, the method comprising steps of: carrying out a scratch test on a surface of a sample (5) by means of a stylus (9) so as to form a scratch along a predetermined track (6), and measuring at least one parameter (Fn, Ft, Pd, Ae, Rd) relating to said scratch; subsequently, acquiring and storing a series of images (13) of at least a part of said scratch, each of said images (13) corresponding to a magnified part of said scratch; subsequently, synchronising said images (13) with the measurements of said at least one parameter (Fn, Ft, Pd, Ae, Rd) in function of displacement of said stylus (9) along said predetermined track (6). According to the invention, a failure point (CP1; CP2) of the surface of the sample (5) is determined based on automatic image recognition carried out on said images (13).
(FR) L'invention concerne un procédé d'évaluation des performances d'une surface d'un matériau, procédé comprenant les étapes consistant : à effectuer un test de rayure sur une surface d'un échantillon (5) à l'aide d'un stylet (9) de manière à former une rayure le long d'une trajectoire prédéterminée (6), et à mesurer au moins un paramètre (Fn, Ft, Pd, Ae, Rd) associé à ladite rayure ; puis à acquérir et à stocker une série d'images (13) d'au moins une partie de ladite rayure, chacune desdites images (13) correspondant à une partie agrandie de ladite rayure ; puis à synchroniser lesdites images (13) avec les mesures dudit ou desdits paramètres (Fn, Ft, Pd, Ae, Rd) en fonction du déplacement dudit stylet (9) le long de ladite trajectoire prédéterminée (6). Selon l'invention, un point de défaillance (CP1 ; CP2) de la surface de l'échantillon (5) est déterminé sur la base d'une reconnaissance automatique d'image exécutée sur lesdites images (13).
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JO, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)