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1. (WO2018007023) METHOD AND SYSTEM ASSEMBLY FOR MONITORING AND/OR VERIFYING AT LEAST ONE QUALITY PARAMETER OF PARTICLE-CONTAINING SAMPLE MATERIALS

Pub. No.:    WO/2018/007023    International Application No.:    PCT/EP2017/025191
Publication Date: Fri Jan 12 00:59:59 CET 2018 International Filing Date: Tue Jul 04 01:59:59 CEST 2017
IPC: G01N 1/20
G01N 15/02
G01N 15/06
G01N 1/22
G01D 3/10
Applicants: RETSCH TECHNOLOGY GMBH
Inventors: BEIL, Sebastian
PANKRATZ, Jürgen
Title: METHOD AND SYSTEM ASSEMBLY FOR MONITORING AND/OR VERIFYING AT LEAST ONE QUALITY PARAMETER OF PARTICLE-CONTAINING SAMPLE MATERIALS
Abstract:
Depicted and described is a method for monitoring and/or verifying at least one quality parameter of particle-containing sample materials (2) by means of a stationary particle analysis system (3), in particular for monitoring and/or verifying the particle size, particle shape, particle distribution and/or the transparency of the particles, the particle analysis system (3) comprising a measuring instrument (4) for measuring at least one quality parameter of particles in a sample material (2), an evaluation device (5) for assessing the measured quality parameter values and generating a warning (8) when at least one quality parameter differs from a threshold value, a display device (7) for displaying the warning (8), and - preferably - a storage device for storing the warning (6). According to the invention, the warning (6) is transmitted as an electronic message to at least one decentralized quality management module (8) that is connected to the particle analysis system (3) via a contactless and/or a wired radio communication link, and said electronic message is - preferably - displayed on a display device (9) of the quality management module (8) and/or is stored in a storage device of the quality management module (8).