Search International and National Patent Collections

1. (WO2018000731) METHOD FOR AUTOMATICALLY DETECTING CURVED SURFACE DEFECT AND DEVICE THEREOF

Pub. No.:    WO/2018/000731    International Application No.:    PCT/CN2016/108866
Publication Date: Fri Jan 05 00:59:59 CET 2018 International Filing Date: Thu Dec 08 00:59:59 CET 2016
IPC: G06T 7/00
G06T 3/40
G06N 3/02
G06K 9/62
Applicants: SOUTH CHINA UNIVERSITY OF TECHNOLOGY
华南理工大学
Inventors: HUANG, Qian
黄茜
HUANG, Zichun
黄梓淳
ZHOU, Zhou
周洲
Title: METHOD FOR AUTOMATICALLY DETECTING CURVED SURFACE DEFECT AND DEVICE THEREOF
Abstract:
A method for automatically detecting curved surface defect and a device thereof, the method comprising: (1) a training phase: acquiring sample images, constructing a training set, performing manual defect identification on the images in the training set, and marking all areas where defects appear; executing a defect pre-targeting step for each image in the training set, so as to obtain all areas R where the defects may appear; comparing R with all of the manually marked areas where the defects appear, dividing into negative samples and positive samples according to an overlap degree between the two; performing offline training of a deep neural network model according to the positive samples and the negative samples, and outputting types and specific coordinates of defect areas; (2) online detection phase: acquiring current curved surface images to be detected, executing the defect pre-targeting step, obtaining a set R, and inputting the set R into the network model to obtain the types and the specific coordinates of the defect areas. The method and device have the advantages of being highly adaptable and real-time, as well as having a high identification accuracy rate.