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1. (WO2017205505) X-RAY COMPUTED TOMOGRAPHY GAUGE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/205505 International Application No.: PCT/US2017/034263
Publication Date: 30.11.2017 International Filing Date: 24.05.2017
IPC:
G01B 21/04 (2006.01) ,G01B 3/30 (2006.01) ,G01N 23/04 (2006.01)
Applicants: HEXAGON METROLOGY, INC.[US/US]; 250 Circuit Drive North Kingstown, Rhode Island 02852, US
Inventors: O'HARE, Jonathan J.; US
GE, Zhanyu; US
Agent: SAUNDERS, Steven G.; US
ASHER, Robert M.; US
BLAU, David E.; US
DECLOUX, Amy; US
FILANDRIANOS, Emmanuel D.; US
JAKOBSCHE, George J.; US
KEYES, William John; US
KLAYMAN, Jeffrey T.; US
LOVELY, Jonathan C.; US
MURPHY, Timothy M.; US
NOLL, Kathryn E.; US
PETUCHOWSKI, Samuel J.; US
SANDVOS, Jay; US
SMOLENSKI, JR., Alexander J.; US
SPAR, Elizabeth N.; US
STICKEVERS, John J.; US
SUNSTEIN, Bruce D.; US
TUYTSCHAEVERS, Thomas J.; US
WILLIAMS, Kathleen M.; US
WU CHIANG, Dorothy; US
Priority Data:
62/340,66924.05.2016US
Title (EN) X-RAY COMPUTED TOMOGRAPHY GAUGE
(FR) JAUGE DE TOMOGRAPHIE PAR RAYONS X PAR ORDINATEUR
Abstract: front page image
(EN) A method of making a gauge for verifying or calibrating an x-ray computed tomography device positions a first plurality of objects on a first substrate, and a second plurality of objects on a second substrate. The method also certifies the positions of both the first plurality of objects on the first substrate, and the second plurality of objects on the second substrate. After certifying both the first and second plurality of objects, the method couples the first substrate with the second substrate.
(FR) L'invention concerne un procédé de fabrication d'une jauge permettant de vérifier ou d'étalonner un dispositif de tomographie par rayons X par ordinateur, qui positionne une première pluralité d'objets sur un premier substrat, et une seconde pluralité d'objets sur un second substrat. Le procédé permet également de certifier les positions à la fois de la première pluralité d'objets sur le premier substrat et de la seconde pluralité d'objets sur le second substrat. Après certification à la fois de la première et de la seconde pluralité d'objets, le procédé accouple le premier substrat au second substrat.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)