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1. (WO2017204591) LABEL INSPECTING DEVICE AND METHOD
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Pub. No.: WO/2017/204591 International Application No.: PCT/KR2017/005510
Publication Date: 30.11.2017 International Filing Date: 26.05.2017
IPC:
G01N 21/88 (2006.01) ,G01J 1/42 (2006.01) ,G01N 21/17 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
84
Systems specially adapted for particular applications
88
Investigating the presence of flaws, defects or contamination
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
1
Photometry, e.g. photographic exposure meter
42
using electric radiation detectors
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
17
Systems in which incident light is modified in accordance with the properties of the material investigated
Applicants: LEE, Eun-Seok[KR/KR]; KR
Inventors: LEE, Eun-Seok; KR
Agent: YOON, Eui-Seoup; KR
Priority Data:
10-2016-006483926.05.2016KR
Title (EN) LABEL INSPECTING DEVICE AND METHOD
(FR) DISPOSITIF ET PROCÉDÉ D’INSPECTION D’ÉTIQUETTE
(KO) 라벨 검사 장치 및 방법
Abstract:
(EN) The present disclosure relates to a label inspecting device for extracting and inspecting a label printed on a specular surface having unevenness, and a label inspecting method using the same. The label inspecting device has a light emitting illuminator arranged at a side of an object having a specular surface on a lower surface thereof, and the illuminator emits the light upward. A light absorbing plate is disposed above the illuminator and absorbs the light emitted from the illuminator. A reflector shade is disposed under the object, and the light, which has not been absorbed by the light absorbing plate, proceeds along a side surface of the object, arrives at the reflector shade, and is reflected by the inner surface of the reflector shade to be projected onto the lower surface of the object. The light, which has arrived at the lower surface of the object, is reflected thereby and is received by a light receiving lens disposed under the reflector shade. An image received by the light receiving lens is sensed by an image sensor disposed under the light receiving lens.
(FR) La présente invention concerne un dispositif d'inspection d'étiquette pour extraire et inspecter une étiquette imprimée sur une surface spéculaire présentant une irrégularité, et un procédé d'inspection d'étiquette utilisant celui-ci. Le dispositif d'inspection d'étiquette comporte un éclairage d’émission de lumière agencé sur un côté d'un objet ayant une surface spéculaire sur une surface inférieure de celui-ci, et l'éclairage émet la lumière vers le haut. Une plaque d'absorption de lumière est disposée au-dessus de l'éclairage et absorbe la lumière émise par l'éclairage. Un réflecteur est disposé sous l'objet, et la lumière, qui n'a pas été absorbée par la plaque d'absorption de lumière, se propage le long d'une surface latérale de l'objet, arrive au niveau du réflecteur, et est réfléchie par la surface interne du réflecteur de façon à être projetée sur la surface inférieure de l'objet. La lumière, qui est arrivée à la surface inférieure de l'objet, est réfléchie par celle-ci et est reçue par une lentille de réception de lumière disposée sous le réflecteur. Une image reçue par la lentille de réception de lumière est détectée par un capteur d'image disposé sous la lentille de réception de lumière.
(KO) 개시된 내용은 굴곡이 있는 정반사 표면에 인쇄된 라벨을 추출하고 검사하는 라벨 검사 장치 및 이를 이용한 라벨 검사 방법에 관한 것으로, 라벨 검사 장치는 하면에 정반사 표면을 갖는 대상체의 측방에는 광을 발산시키는 조명이 배열되고, 조명은 상부로 광을 조사한다. 흡광판은 조명의 상부에 구비되어 조명에서 발산된 광을 흡광한다. 반사갓은 대상체의 하부에 구비되고, 흡광판에서 흡수되지 못한 광이 대상체의 측면 표면을 따라 진행하여 반사갓에 도달하고, 광은 반사갓 내면에서 반사되어 대상체 하면에 투영되도록 한다. 대상체 하면에 도달한 광은 반사되어 반사갓 하부에 구비되는 수광렌즈에 수광되고, 수광렌즈에서 수광된 이미지는 수광렌즈 하부에 구비된 영상센서로 감지된다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)