WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2017204414) METHOD AND APPARATUS FOR ANALYZING DEGREE OF CROSS-CONTAMINATION OF SAMPLE
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.:    WO/2017/204414    International Application No.:    PCT/KR2016/009451
Publication Date: 30.11.2017 International Filing Date: 25.08.2016
IPC:
G06F 19/18 (2011.01), G06F 19/22 (2011.01), C12Q 1/68 (2006.01)
Applicants: SAMSUNG ELECTRONICS CO., LTD. [KR/KR]; 129, Samsung-ro Yeongtong-gu,Suwon-si Gyeonggi-do 16677 (KR).
SAMSUNG LIFE PUBLIC WELFARE FOUNDATION [KR/KR]; 48,Itaewon-ro 55-gil Yongsan-gu Seoul 04348 (KR)
Inventors: PARK, Donghyun; (KR).
SON, Daesoon; (KR).
PARK, Woongyang; (KR)
Agent: Y.P.LEE, MOCK & PARTNERS; 12F Daelim Acrotel 13 Eonju-ro 30-gil Gangnam-gu Seoul 06292 (KR)
Priority Data:
10-2016-0064067 25.05.2016 KR
Title (EN) METHOD AND APPARATUS FOR ANALYZING DEGREE OF CROSS-CONTAMINATION OF SAMPLE
(FR) PROCÉDÉ ET APPAREIL PERMETTANT D'ANALYSER LE DEGRÉ DE CONTAMINATION CROISÉE D'UN ÉCHANTILLON
(KO) 시료의 교차 오염 정도를 분석하는 방법 및 장치
Abstract: front page image
(EN)Provided are a method and an apparatus for analyzing a degree of cross-contamination of a sample with regard to a target sample, comprising the steps of: acquiring first sequence information of a nucleic acid fragment from each of a target sample and an additional sample, and second sequence information of a nucleic acid fragment from a mixed sample of the target sample and the additional sample; calculating allele frequency from each of the first sequence information and the second sequence information acquired; and comparing the calculated allele frequencies with regard to a specific chromosomal locus. By measuring a degree of cross-contamination between samples at a specific chromosomal locus, the method and the apparatus can guarantee reliability to variation detection results.
(FR)L'invention concerne un procédé et un appareil permettant d'analyser le degré de contamination croisée d'un échantillon par rapport à un échantillon cible, comprenant les étapes consistant : à acquérir des premières informations de séquence d'un fragment d'acide nucléique à partir d'un échantillon cible et à partir d'un échantillon supplémentaire, et des deuxièmes informations de séquence d'un fragment d'acide nucléique à partir d'un échantillon mixte de l'échantillon cible et de l'échantillon supplémentaire ; à calculer la fréquence allélique à partir des premières informations de séquence et à partir des deuxièmes informations de séquence acquises ; et à comparer les fréquences alléliques calculées par rapport à un locus chromosomique spécifique. Par la mesure du degré de contamination croisée entre des échantillons au niveau d'un locus chromosomique spécifique, le procédé et l'appareil selon l'invention permettent de garantir la fiabilité de résultats de détection de variation.
(KO)표적 시료 및 추가 시료 각각으로부터 핵산 단편의 제1 서열정보, 및 상기 표적 시료 및 추가 시료가 혼합된 혼합 시료로부터 핵산 단편의 제2 서열정보를 수득하는 단계; 수득된 제1 서열정보 및 제2 서열정보로부터 각각 대립유전자 빈도를 산출하는 단계; 및 염색체의 특정 자리에 대하여, 산출된 대립유전자 빈도를 비교하는 단계를 포함하는, 표적 시료에 대한 시료의 교차 오염 정도를 분석하는 방법 및 장치를 제공한다. 상기 방법 및 장치는 특정 염색체 자리에서 시료간 교차 오염 정도를 측정하여, 변이 추출 결과에 신뢰도를 부여할 수 있다.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KN, KP, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW.
African Regional Intellectual Property Organization (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Organization (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG).
Publication Language: Korean (KO)
Filing Language: Korean (KO)