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1. (WO2017201450) SYSTEMS, APPARATUS, AND METHODS OF NONLINEAR TERAHERTZ (THZ) MAGNETIC RESONANCE MEASUREMENT
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Pub. No.: WO/2017/201450 International Application No.: PCT/US2017/033613
Publication Date: 23.11.2017 International Filing Date: 19.05.2017
IPC:
G01J 3/28 (2006.01) ,G01R 33/381 (2006.01) ,G01V 3/00 (2006.01) ,G01V 3/18 (2006.01)
G PHYSICS
01
MEASURING; TESTING
J
MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
3
Spectrometry; Spectrophotometry; Monochromators; Measuring colours
28
Investigating the spectrum
G PHYSICS
01
MEASURING; TESTING
R
MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
33
Arrangements or instruments for measuring magnetic variables
20
involving magnetic resonance
28
Details of apparatus provided for in groups G01R33/44-G01R33/6496
38
Systems for generation, homogenisation or stabilisation of the main or gradient magnetic field
381
using electromagnets
G PHYSICS
01
MEASURING; TESTING
V
GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
3
Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination or deviation
G PHYSICS
01
MEASURING; TESTING
V
GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
3
Electric or magnetic prospecting or detecting; Measuring magnetic field characteristics of the earth, e.g. declination or deviation
18
specially adapted for well-logging
Applicants:
MASSACHUSETTS INSTITUTE OF TECHNOLOGY [US/US]; 77 Massachusetts Ave Cambridge, Massachusetts 02139, US
Inventors:
LU, Jian; US
LI, Xian; US
ZHANG, Yaqing; US
HWANG, Harold Y.; US
NELSON, Keith A.; US
OFORI-OKAI, Benjamin K.; US
Agent:
COLICE, Christopher Max; US
TEJA, Joseph, Jr.; US
LUO, Yushan; US
CAMPBELL, Christopher C.; US
Priority Data:
62/338,84319.05.2016US
Title (EN) SYSTEMS, APPARATUS, AND METHODS OF NONLINEAR TERAHERTZ (THZ) MAGNETIC RESONANCE MEASUREMENT
(FR) SYSTÈMES, APPAREIL ET PROCÉDÉS DE MESURE DE RÉSONANCE MAGNÉTIQUE TÉRAHERTZ (THZ) NON LINÉAIRE
Abstract:
(EN) A nonlinear terahertz (THz) spectroscopy technique uses a sample illuminated by two THz pulses separately. The illumination generates two signals BA and BB, corresponding to the first and second THz pulse, respectively, after interaction with the sample. The interaction includes excitation of at least one ESR transition in the sample. The sample is also illuminated by the two THz pulses together, with an inter-pulse delay r, generating a third signal BAB. A nonlinear signal BNL is then derived via BNL= BAB - BA - BB. This nonlinear signal BNL can be then processed (e.g., Fourier transform) to study the properties of the sample.
(FR) Une technique de spectroscopie térahertz non linéaire (THz) utilise un échantillon éclairé par deux impulsions THz séparément. L'illumination génère deux signaux BA et BB, correspondant aux première et deuxième impulsions THz, respectivement, après interaction avec l'échantillon. L'interaction comprend l'excitation d'au moins une transition ESR dans l'échantillon. L'échantillon est également éclairé par les deux impulsions THz conjointement, avec un retard inter-impulsion r, de façon à générer un troisième signal BAB. Un signal non linéaire BNL est ensuite déduit par l'intermédiaire de BNL = BAB - BA - BB. Ce signal non linéaire BNL peut ensuite être traité (par exemple, par transformée de Fourier) pour étudier les propriétés de l'échantillon.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)