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1. (WO2017200363) SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PROBE AND A SPECIMEN

Pub. No.:    WO/2017/200363    International Application No.:    PCT/KZ2017/000010
Publication Date: Fri Nov 24 00:59:59 CET 2017 International Filing Date: Fri May 19 01:59:59 CEST 2017
IPC: G01Q 10/00
G01Q 80/00
Applicants: CHASTNOE UCHREZHDENIE "NAZARBAYEV UNIVERSITY RESEARCH AND INNOVATION SYSTEM"
ЧАСТНОЕ УЧРЕЖДЕНИЕ "НАЗАРБАЕВ УНИВЕРСИТЕТ РИСЕЧ ЭНД ИННОВЭЙШН СИСТЭМ"
Inventors: ALEKSEEV, Alexander Mihaylovich
АЛЕКСЕЕВ, Александр Михайлович
VOLKOV, Aleksey Dmitrievich
ВОЛКОВ, Алексей Дмитриевич
SOKOLOV, Dmitry Yurjevich
СОКОЛОВ, Дмитрий Юрьевич
EFIMOV, Anton Ebgenievich
ЕФИМОВ, Антон Евгеньевич
Title: SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PROBE AND A SPECIMEN
Abstract:
A scanning probe microscope combined with a device for acting on a probe and a specimen relates to measurement technology, more specifically to devices for measuring objects by probe methods after nano-sectioning. Same can be used for studying the structures of biological and polymeric specimens under low-temperature conditions. The aim of the invention is to raise the operating efficiency of elements of the measurement unit of a scanning probe microscope which is combined with a device for acting on a probe and a specimen. The technical result of the invention consists in raising the resolution of the device and the quality of the image, as well as expanding the functional capabilities of the device by examining a broader range of specimens.