WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2017198736) X-RAY SCATTERING APPARATUS
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/198736 International Application No.: PCT/EP2017/061894
Publication Date: 23.11.2017 International Filing Date: 17.05.2017
IPC:
G01N 23/20 (2006.01) ,G01N 23/201 (2006.01)
Applicants: XENOCS SA[FR/FR]; 19, Rue François Blumet 38360 Sassenage, FR
Inventors: HØGHØJ, Peter; FR
Agent: BETTEN & RESCH PATENT- UND RECHTSANWÄLTE PARTGMBB; Maximiliansplatz 14 80333 München, DE
Priority Data:
16290087.220.05.2016EP
Title (EN) X-RAY SCATTERING APPARATUS
(FR) APPAREIL DE DIFFRACTION DES RAYONS X
Abstract: front page image
(EN) The invention relates to an X-ray scattering apparatus, comprising: - a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering; - an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder; - a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and - a distal X-ray detector (14) arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam.
(FR) L'invention concerne un appareil de diffraction des rayons X, comprenant : - un porte-échantillon permettant d'aligner et orienter un échantillon (12) à analyser par diffraction des rayons X; - un système de distribution de faisceau de rayons X agencé en amont du porte-échantillon permettant de générer et diriger un faisceau de rayons X direct le long d'une direction de propagation (X) vers le porte-échantillon; - un détecteur de rayons X proximal (10) agencé en aval du porte-échantillon de manière à laisser passer le faisceau de rayons X direct et à détecter les rayons X diffractés par l'échantillon (12); et - un détecteur de rayons X distal (14) agencé en aval du porte-échantillon et mobile le long de la direction de propagation (X) du faisceau de rayons X direct; le détecteur de rayons X proximal (10) étant également mobile sensiblement le long de la direction de propagation (X) du faisceau de rayons X direct.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)