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1. WO2017198736 - X-RAY SCATTERING APPARATUS

Publication Number WO/2017/198736
Publication Date 23.11.2017
International Application No. PCT/EP2017/061894
International Filing Date 17.05.2017
IPC
G01N 23/20 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N 23/201 2006.01
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/-G01N17/178
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201Measuring small-angle scattering, e.g. small angle X-ray scattering
CPC
G01N 2223/50
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
50Detectors
G01N 2223/501
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
2223Investigating materials by wave or particle radiation
50Detectors
501array
G01N 23/20
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
G01N 23/20008
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
G01N 23/201
GPHYSICS
01MEASURING; TESTING
NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
23Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00G01N17/00, G01N21/00 or G01N22/00
20by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
201by measuring small-angle scattering
Applicants
  • XENOCS SA [FR]/[FR]
Inventors
  • HØGHØJ, Peter
Agents
  • BETTEN & RESCH PATENT- UND RECHTSANWÄLTE PARTGMBB
Priority Data
16290087.220.05.2016EP
Publication Language English (EN)
Filing Language English (EN)
Designated States
Title
(EN) X-RAY SCATTERING APPARATUS
(FR) APPAREIL DE DIFFRACTION DES RAYONS X
Abstract
(EN)
The invention relates to an X-ray scattering apparatus, comprising: - a sample holder for aligning and orienting a sample (12) to be analyzed by X-ray scattering; - an X-ray beam delivery system arranged upstream of the sample holder for generating and directing a direct X-ray beam along a propagation direction (X) towards the sample holder; - a proximal X-ray detector (10) arranged downstream of the sample holder such as to let the direct X-ray beam pass and detect X rays scattered from the sample (12); and - a distal X-ray detector (14) arranged downstream of the sample holder and movable along the propagation direction (X) of the direct X-ray beam; wherein the proximal X-ray detector (10) is also movable essentially along the propagation direction (X) of the direct X-ray beam.
(FR)
L'invention concerne un appareil de diffraction des rayons X, comprenant : - un porte-échantillon permettant d'aligner et orienter un échantillon (12) à analyser par diffraction des rayons X; - un système de distribution de faisceau de rayons X agencé en amont du porte-échantillon permettant de générer et diriger un faisceau de rayons X direct le long d'une direction de propagation (X) vers le porte-échantillon; - un détecteur de rayons X proximal (10) agencé en aval du porte-échantillon de manière à laisser passer le faisceau de rayons X direct et à détecter les rayons X diffractés par l'échantillon (12); et - un détecteur de rayons X distal (14) agencé en aval du porte-échantillon et mobile le long de la direction de propagation (X) du faisceau de rayons X direct; le détecteur de rayons X proximal (10) étant également mobile sensiblement le long de la direction de propagation (X) du faisceau de rayons X direct.
Also published as
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