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1. (WO2017188085) OPTICAL ANALYSIS DEVICE AND OPTICAL ANALYSIS METHOD

Pub. No.:    WO/2017/188085    International Application No.:    PCT/JP2017/015719
Publication Date: Fri Nov 03 00:59:59 CET 2017 International Filing Date: Thu Apr 20 01:59:59 CEST 2017
IPC: G01J 3/50
C09D 5/36
C09D 201/00
G01N 21/27
G01N 21/57
Applicants: KONICA MINOLTA, INC.
コニカミノルタ株式会社
Inventors: YAMANOI, Yuta
山野井 勇太
SETOGUCHI, Tomomi
瀬戸口 知巳
TERAOKA, Yoshitaka
寺岡 良隆
Title: OPTICAL ANALYSIS DEVICE AND OPTICAL ANALYSIS METHOD
Abstract:
In the present invention, among respective reflectances of a plurality of wavelength components constituting reflected light in a highlight direction reflected from a brilliant material-containing coating film, the difference between the reflectance at a first wavelength component that is a peak value and the reflectance at a second wavelength component having a predetermined wavelength is taken as a first difference value. A measurement unit measures the reflectance at the first wavelength component and the reflectance at the second wavelength component for the reflected light of the highlight direction, with respect to the brilliant material-containing coating film which serves as a measurement subject. A first calculation unit calculates the first difference value by using the result measured at the measurement unit. A storage unit stores, in advance, correlation information indicative of a correlation of the brilliant material contained in the brilliant material-containing coating film, between an index value indicative of a predetermined physical feature and the first difference value. An index value calculation unit uses the first difference value calculated at the first calculation unit and the correlation information to calculate the index value of the brilliant material-containing coating film serving as the measurement subject.