Search International and National Patent Collections

1. (WO2017186056) SURFACE ENHANCED RAMAN SCATTERING TECHNIQUE BASED DETECTION CHIP, PREPARATION METHOD THEREFOR, KIT AND TUMOUR DETECTION METHOD

Pub. No.:    WO/2017/186056    International Application No.:    PCT/CN2017/081420
Publication Date: Fri Nov 03 00:59:59 CET 2017 International Filing Date: Sat Apr 22 01:59:59 CEST 2017
IPC: G01N 21/65
Applicants: INSTITUTE OF HIGH ENERGY PHYSICS , CHINESE ACADEMY OF SCIENCES
中国科学院高能物理研究所
Inventors: LI, Min
李敏
ZHU, Wenfeng
朱文凤
ZHAO, Yuliang
赵宇亮
Title: SURFACE ENHANCED RAMAN SCATTERING TECHNIQUE BASED DETECTION CHIP, PREPARATION METHOD THEREFOR, KIT AND TUMOUR DETECTION METHOD
Abstract:
Provided is a surface enhanced Raman scattering technique based detection chip, comprising: a nano metal substrate, two or more signal molecules, and two or more detection objects for detecting tumour markers, wherein the signal molecules are uniformly distributed on the substrate, and the detection objects are respectively fixed onto different signal molecules. Also provided are a preparation method for a detection chip, and a kit containing same, and a tumour detection method. By fixing different Raman signal molecules to different micro zones, synchronous and quantitative detection of a plurality of tumour markers are realized by using a nano-stress sensing technique, having a tremendous application potential.