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1. (WO2017185141) A METHOD AND SYSTEM FOR IDENTIFYING AND MEASURING A DEFECT THAT REDUCES TRANSPARENCY IN A SUBSTRATE FOR A SECURITY DOCUMENT

Pub. No.:    WO/2017/185141    International Application No.:    PCT/AU2017/050392
Publication Date: Fri Nov 03 00:59:59 CET 2017 International Filing Date: Sat Apr 29 01:59:59 CEST 2017
IPC: G06T 7/00
Applicants: CCL SECURE PTY LTD
Inventors: STEVENS, Ben Paul
PHILLIPS, Darren
Title: A METHOD AND SYSTEM FOR IDENTIFYING AND MEASURING A DEFECT THAT REDUCES TRANSPARENCY IN A SUBSTRATE FOR A SECURITY DOCUMENT
Abstract:
A method of measuring a defect level of a region of a substrate for a security document, wherein the defect level is associated with reduced transparency of the region of the substrate, the method including the steps of: digitally imaging the region to create a digital image, the digital image containing light intensity data; and analysing the digital image including: calculating a statistical measure of the light intensity data in the region; and assigning a defect score to the region based on the statistical measure of the light intensity data in the region.