WIPO logo
Mobile | Deutsch | Español | Français | 日本語 | 한국어 | Português | Русский | 中文 | العربية |
PATENTSCOPE

Search International and National Patent Collections
World Intellectual Property Organization
Search
 
Browse
 
Translate
 
Options
 
News
 
Login
 
Help
 
Machine translation
1. (WO2017184564) SENSORS AND SENSOR ARRAYS FOR DETECTION OF ANALYTES
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/184564 International Application No.: PCT/US2017/028064
Publication Date: 26.10.2017 International Filing Date: 18.04.2017
IPC:
G01N 33/18 (2006.01) ,G01N 23/223 (2006.01)
Applicants: ICAGEN, INC.[US/US]; 4222 Emperor Blvd. Suite 350 Durham, NC 27703, US
Inventors: WARNER, Benjamin, P.; US
HSIEH, Chang-Tai; US
SOLOMON, Emilia; US
PETERSON, Lori; US
KRAFTE, Douglas; US
ZAHLER, Nathan; US
Agent: ALTIERI, Stephen, L.; US
CURRIE, Matthew, T.; US
HAYMAN, Mark, L.; US
LIN, Yi-chia; US
FRANK, Steven, J.; US
Priority Data:
62/324,05718.04.2016US
62/337,55117.05.2016US
62/341,40325.05.2016US
Title (EN) SENSORS AND SENSOR ARRAYS FOR DETECTION OF ANALYTES
(FR) CAPTEURS ET RÉSEAUX DE CAPTEURS POUR LA DÉTECTION D'ANALYTES
Abstract: front page image
(EN) Methods, apparatus and compositions are described for the measurement of metal and/or metalloid elements, including selenium in samples.
(FR) L'invention concerne des procédés, un appareil et des compositions pour la mesure d'éléments métalliques et/ou métalloïdes, notamment le sélénium, dans des échantillons.
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: English (EN)
Filing Language: English (EN)