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1. (WO2017175470) SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD

Pub. No.:    WO/2017/175470    International Application No.:    PCT/JP2017/004344
Publication Date: Fri Oct 13 01:59:59 CEST 2017 International Filing Date: Wed Feb 08 00:59:59 CET 2017
IPC: A61B 5/026
G01B 11/00
G01N 21/49
G01P 5/22
Applicants: SONY CORPORATION
ソニー株式会社
Inventors: AIZAWA, Kota
相澤 耕太
OKUBO, Atsushi
大久保 厚志
WAKITA, Yoshihiro
脇田 能宏
Title: SPECKLE MEASUREMENT DEVICE AND SPECKLE MEASUREMENT METHOD
Abstract:
[Problem] To improve the accuracy of flow rate measurements and the like that target particles such as red blood cells. [Solution] This speckle measurement device comprises: an imaging unit that captures, as speckle images, images of scattered light returning from an object to be measured when the object to be measured is irradiated with coherent light; and a control unit that factors in movement in the relative positional relationship between the object to be measured and the imaging unit, and determines the measurement region corresponding to the same site of the object to be measured in a plurality of the speckle images captured continuously over time by the imaging unit.