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1. (WO2017172307) METHOD AND APPARATUS FOR SAMPLING PATTERN GENERATION FOR A RAY TRACING ARCHITECTURE

Pub. No.:    WO/2017/172307    International Application No.:    PCT/US2017/021267
Publication Date: Fri Oct 06 01:59:59 CEST 2017 International Filing Date: Thu Mar 09 00:59:59 CET 2017
IPC: G06T 15/06
G06T 1/20
G06T 1/60
Applicants: INTEL CORPORATION
Inventors: BALDWIN, David R.
Title: METHOD AND APPARATUS FOR SAMPLING PATTERN GENERATION FOR A RAY TRACING ARCHITECTURE
Abstract:
An apparatus and method for sampling pattern generation in a ray tracing architecture. For example, one embodiment of a graphics processing apparatus comprises: a ray generation circuit to generate a ray stream from one or more image tiles; and a sample pattern generation circuit to generate samples for rays in the ray stream, the samples generated to exhibit at least some randomness across pixels of a given frame but be repeatable across multiple frames.