Search International and National Patent Collections

1. (WO2017168524) ANALYSIS SERVER DEVICE, DATA ANALYSIS SYSTEM, AND DATA ANALYSIS METHOD

Pub. No.:    WO/2017/168524    International Application No.:    PCT/JP2016/059940
Publication Date: Fri Oct 06 01:59:59 CEST 2017 International Filing Date: Tue Mar 29 01:59:59 CEST 2016
IPC: G06F 17/30
G06F 19/00
Applicants: HITACHI, LTD.
株式会社日立製作所
Inventors: SERITA Susumu
芹田 進
TAJIMA Yoshiyuki
但馬 慶行
AKITOMI Tomoaki
秋富 知明
KUDO Fumiya
工藤 文也
Title: ANALYSIS SERVER DEVICE, DATA ANALYSIS SYSTEM, AND DATA ANALYSIS METHOD
Abstract:
A technology for extracting a factor (pattern of event) that affects an objective index (objective variable) is provided. A data analysis device according to the present disclosure executes, with respect to explanatory variable data included in data to be analyzed, a process for generating a time-series pattern in a predetermined range, a process for calculating a correlation value between the time-series pattern and at least one piece of objective variable data included in the data to be analyzed, and a process for outputting, as an analysis result, the time-series pattern corresponding to the correlation value with the correlation value.