Search International and National Patent Collections

1. (WO2017156000) SAMPLE PROCESSING AND ANALYSIS METHODS AND APPARATUS

Pub. No.:    WO/2017/156000    International Application No.:    PCT/US2017/021162
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Wed Mar 08 00:59:59 CET 2017
IPC: G01N 1/28
G02B 21/34
Applicants: BATTELLE MEMORIAL INSTITUTE
Inventors: MILLER, Micah, D.
MCKINLEY, James, Preston
Title: SAMPLE PROCESSING AND ANALYSIS METHODS AND APPARATUS
Abstract:
Sample handling, processing and analysis methods and apparatus are described. According to one aspect, a sample processing method includes providing a sample, providing a reference frame which comprises a plurality of markers arranged in a predefined pattern, wherein individual ones of the markers are uniquely identifiable from others of the markers, and associating the reference frame comprising the markers with the sample. The markers are amenable to human or machine reading and for computational manipulation in some examples.