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1. (WO2017155363) MASS SPECTROMETRY METHOD
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Pub. No.: WO/2017/155363 International Application No.: PCT/KR2017/002662
Publication Date: 14.09.2017 International Filing Date: 13.03.2017
IPC:
G01N 27/68 (2006.01) ,G01N 21/71 (2006.01) ,H05H 1/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
62
by investigating the ionisation of gases; by investigating electric discharges, e.g. emission of cathode
68
using electric discharge to ionise a gas
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
71
thermally excited
H ELECTRICITY
05
ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
H
PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY- CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
1
Generating plasma; Handling plasma
Applicants:
한국생명공학연구원 KOREA RESEARCH INSTITUTE OF BIOSCIENCE AND BIOTECHNOLOGY [KR/KR]; 대전시 유성구 과학로 125 125, Gwahak-ro, Yuseong-gu, Daejeon 34141, KR
한국표준과학연구원 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE [KR/KR]; 대전시 유성구 가정로 267 267, Gajeong-ro, Yuseong-gu, Daejeon 34113, KR
Inventors:
박병철 PARK, Byoung Chul; KR
임용현 YIM, Yong Hyeon; KR
허성우 HEO, Sung Woo; KR
김정훈 KIM, Jeong Hoon; KR
문정희 MOON, Jeong Hee; KR
박성구 PARK, Sung Goo; KR
오지선 OH, Ji Seon; KR
이형준 LEE, Hyoung Jun; KR
Agent:
특허법인 태평양 BAE, KIM & LEE IP GROUP; 서울시 서초구 강남대로 343, 11층 11th Floor, 343, Gangnam-daero, Seocho-gu, Seoul 06626, KR
Priority Data:
10-2016-002941511.03.2016KR
Title (EN) MASS SPECTROMETRY METHOD
(FR) PROCÉDÉ DE SPECTROMÉTRIE DE MASSE
(KO) 질량분석 방법
Abstract:
(EN) The present invention relates to a mass spectrometry method including the use of transition reactions of charged particles to selectively ionize a target compound from a sample mixture in which a sample, including the target compound and one or more interfering compounds, is mixed with an additive having a higher charged particle affinity than the one or more interfering compounds. According to a mass spectrometry method of the present invention, the sensitivity by which ions originating from a target compound in a sample are analyzed by a mass spectrometer may be selectively enhanced by efficiently controlling the ionization of interfering compounds — which are in the sample but are not the target compound — caused by transition reactions of charged particles, such as protons, electrons, etc., accompanying the prescribed addition of additives.
(FR) La présente invention concerne un procédé de spectrométrie de masse comprenant l'utilisation de réactions de transition de particules chargées pour sélectivement ioniser un composé cible provenant d'un mélange d'échantillons dans lequel un échantillon, comprenant le composé cible et un ou plusieurs composés perturbateur, est mélangé avec un additif ayant une affinité de particule chargée plus élevée que celle du ou des composés perturbateurs. Selon un procédé de spectrométrie de masse de la présente invention, la sensibilité par laquelle des ions provenant d'un composé cible dans un échantillon sont analysés par un spectromètre de masse peut être sélectivement améliorée en commandant efficacement l'ionisation de composés perturbateurs, qui sont dans l'échantillon mais ne sont pas le composé cible, provoquée par des réactions de transition de particules chargées, tels que des protons, des électrons, etc., accompagnant l'ajout prescrit d'additifs.
(KO) 본 발명은 목표 화합물 및 적어도 하나의 방해 화합물을 포함하는 시료에 상기 적어도 하나의 방해 화합물보다 하전 입자(charged particle) 친화도가 높은 첨가제를 혼합한 시료 혼합물로부터 하전 입자의 전이 반응에 의하여 목표 화합물을 선택적으로 이온화시키는 것을 포함하는 질량분석 방법에 관한 것이다. 본 발명에 따른 질량분석 방법에 의하면, 시료에 포함된 목표 화합물 이외의 방해 화합물이 소정의 첨가제의 첨가에 수반하여 양성자, 전자 등의 하전 입자의 전이 반응에 의한 이온화되는 것이 효율적으로 제어됨으로써 시료 중의 목표 화합물 유래의 이온이 질량측정기에 의해서 분석되는 감도를 선택적으로 향상시킬 수 있다.
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Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Korean (KO)
Filing Language: Korean (KO)