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1. (WO2017155258) X-RAY INSPECTION APPARATUS

Pub. No.:    WO/2017/155258    International Application No.:    PCT/KR2017/002382
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Tue Mar 07 00:59:59 CET 2017
IPC: A61B 6/00
A61B 6/04
Applicants: ZETTAIMAGINE CO., LTD.
주식회사 제타이미징
Inventors: SHIN, Young Hoon
신영훈
Title: X-RAY INSPECTION APPARATUS
Abstract:
Disclosed is an X-ray inspection apparatus. The X-ray inspection apparatus according to an embodiment of the present invention comprises: an X-ray emitting unit; an inspection object table on which an object to be inspected is placed; an X-ray detector disposed below the inspection object table; and a grid member which is disposed between the inspection object table and the X-ray detector, the grid member comprising a plurality of X-ray penetration holes which are axisymmetrically arranged with respect to an axis of symmetry which is parallel with the width direction of the grid member. When the X-ray inspection apparatus is in an initial setting mode, the X-ray emitting unit is disposed in the position of an initial emitting unit which is aligned on the axis of symmetry of the grid member, and the inspection object table is disposed in the position of an initial table which is aligned on the axis of symmetry of the grid member. When the X-ray emitting unit has an oblique emitting posture, the inspection object table is horizontally moved along the longitudinal direction and is disposed in the position of an adjustment table which has a position difference with respect to the position of the initial table.