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1. (WO2017155134) PROBE MEMBER FOR INSPECTION

Pub. No.:    WO/2017/155134    International Application No.:    PCT/KR2016/002314
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Thu Mar 10 00:59:59 CET 2016
IPC: G01R 1/073
G01R 1/067
G01R 31/26
G01R 31/28
Applicants: ISC CO., LTD.
주식회사 아이에스시
Inventors: CHUNG, Young Bae
정영배
Title: PROBE MEMBER FOR INSPECTION
Abstract:
The present invention relates to a probe member for inspection and, more particularly, to a probe member for inspection in which at least a part thereof is inserted into a cylindrical body and an upper end thereof is in contact with a terminal of a semiconductor device, the probe member comprising: a first probe portion of a pointed shape having, at an upper end thereof, a first sharp end which is in contact with the terminal of the semiconductor device; a first probe plate extending downwardly from the first probe portion and comprising a first coupling portion inserted into the cylindrical body to be coupled to the cylindrical body; a second probe portion of a pointed shape having, at an upper end thereof, a second sharp end which is in contact with the terminal of the semiconductor device; and a second probe plate extending downwardly from the second probe portion and comprising a second coupling portion inserted into the cylindrical body to be coupled to the cylindrical body, wherein the first probe plate and the second probe plate are integrally combined in a state where the first probe and the second probe are staggered from each other.