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1. (WO2017155084) SCANNED ANTENNA AND METHOD OF INSPECTING SCANNED ANTENNA

Pub. No.:    WO/2017/155084    International Application No.:    PCT/JP2017/009701
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Sat Mar 11 00:59:59 CET 2017
IPC: H01Q 3/34
G02F 1/13
H01L 29/786
H01P 11/00
H01Q 3/44
H01Q 13/22
H01Q 21/06
Applicants: SHARP KABUSHIKI KAISHA
シャープ株式会社
Inventors: YASUO Fumitoshi
安尾 文利
HARA Takeshi
原 猛
KADONO Shinya
門野 真也
INUKAI Junichi
犬飼 順一
KOSAKA Tomohiro
小坂 知裕
Title: SCANNED ANTENNA AND METHOD OF INSPECTING SCANNED ANTENNA
Abstract:
This scanned antenna is provided with a TFT substrate having a plurality of patch electrodes (15), a slot substrate having a slot electrode (55), and a liquid crystal layer provided between the TFT substrate and the slot substrate. The slot electrode (55) includes a plurality of slots (57) disposed corresponding to the plurality of patch electrodes 15, and solid portions (56) in which the plurality of slots (57) are not formed. When viewed from a direction normal to the substrate, in each of a plurality of antenna units the patch electrodes (15) are disposed in such a way as to cross the slots (57) in a first direction and to overlap the solid portions (56) on either side of the slots (57). When viewed from the direction normal to the substrate, in at least some antenna units from among the plurality of antenna units, at least one of the peripheral edges of the solid portions (56) and the peripheral edges of the patch electrodes (15) have recessed portions (81, 82) or protruding portions.