Search International and National Patent Collections

1. (WO2017154990) SAMPLE CAPTURE DEVICE, ANALYSIS APPARATUS INCLUDING SAMPLE CAPTURE DEVICE, AND METHOD FOR PRODUCING SAMPLE CAPTURE DEVICE

Pub. No.:    WO/2017/154990    International Application No.:    PCT/JP2017/009293
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Thu Mar 09 00:59:59 CET 2017
IPC: G01N 1/22
Applicants: NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
国立大学法人名古屋大学
Inventors: BABA Yoshinobu
馬場 嘉信
KAJI Noritada
加地 範匡
YASUI Takao
安井 隆雄
SHIMADA Taisuke
嶋田 泰佑
HIBARA Akihide
火原 彰秀
Title: SAMPLE CAPTURE DEVICE, ANALYSIS APPARATUS INCLUDING SAMPLE CAPTURE DEVICE, AND METHOD FOR PRODUCING SAMPLE CAPTURE DEVICE
Abstract:
The present invention addresses the problem of providing a sample capture device with which it is possible to capture suspended particles in the atmosphere. The aforementioned problem is solved by providing a sample capture device in the atmosphere, the device including a substrate and nanowires formed on the substrate, the nanowires including core nanowires and a coating layer formed on the outer periphery of the core nanowires, and the coating layer comprising titanium dioxide that has an anatase crystal structure.