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|1. (WO2017154990) SAMPLE CAPTURE DEVICE, ANALYSIS APPARATUS INCLUDING SAMPLE CAPTURE DEVICE, AND METHOD FOR PRODUCING SAMPLE CAPTURE DEVICE|
|Applicants:||NATIONAL UNIVERSITY CORPORATION NAGOYA UNIVERSITY
|Title:||SAMPLE CAPTURE DEVICE, ANALYSIS APPARATUS INCLUDING SAMPLE CAPTURE DEVICE, AND METHOD FOR PRODUCING SAMPLE CAPTURE DEVICE|
The present invention addresses the problem of providing a sample capture device with which it is possible to capture suspended particles in the atmosphere. The aforementioned problem is solved by providing a sample capture device in the atmosphere, the device including a substrate and nanowires formed on the substrate, the nanowires including core nanowires and a coating layer formed on the outer periphery of the core nanowires, and the coating layer comprising titanium dioxide that has an anatase crystal structure.