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1. (WO2017154751) SAMPLE ACCOMMODATION DISK AND FLUORESCENCE DETECTION DEVICE USING SAME
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Pub. No.: WO/2017/154751 International Application No.: PCT/JP2017/008403
Publication Date: 14.09.2017 International Filing Date: 03.03.2017
IPC:
G01N 21/03 (2006.01) ,G01N 21/64 (2006.01) ,G01N 35/00 (2006.01) ,G01N 37/00 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
01
Arrangements or apparatus for facilitating the optical investigation
03
Cuvette constructions
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
21
Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible, or ultra-violet light
62
Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
63
optically excited
64
Fluorescence; Phosphorescence
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
35
Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/-G01N33/148; Handling materials therefor
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
37
Details not covered by any other group of this subclass
Applicants:
パナソニック株式会社 PANASONIC CORPORATION [JP/JP]; 大阪府門真市大字門真1006番地 1006, Oaza Kadoma, Kadoma-shi, Osaka 5718501, JP
Inventors:
永冨 謙司 NAGATOMI Kenji; --
川西 努 KAWANISHI Tsutomu; --
寺原 範晃 TERAHARA Noriaki; --
山崎 文朝 YAMASAKI Fumitomo; --
古宮 成 FURUMIYA Shigeru; --
大森 健志 OHMORI Takeshi; --
林 拓哉 HAYASHI Takuya; --
Agent:
徳田 佳昭 TOKUDA Yoshiaki; JP
野村 幸一 NOMURA Koichi; JP
Priority Data:
2016-04838011.03.2016JP
2016-04838111.03.2016JP
2016-04838211.03.2016JP
2016-04838311.03.2016JP
2016-04838411.03.2016JP
Title (EN) SAMPLE ACCOMMODATION DISK AND FLUORESCENCE DETECTION DEVICE USING SAME
(FR) DISQUE DE RÉCEPTION D'ÉCHANTILLON ET DISPOSITIF DE DÉTECTION DE FLUORESCENCE L'UTILISANT
(JA) 試料収容ディスクおよびそれを用いた蛍光検出装置
Abstract:
(EN) A sample accommodation disk is provided with a substrate, tracks formed on the upper surface of the substrate so as to circle around the center of the disk, and sample accommodation parts that are disposed above the tracks and accommodate a sample. The tracks are configured so as to be scanned in a scanning direction. For each track part of the tracks that passes under a sample accommodation part, address signals indicating the position of the track part are recorded on the upstream side and downstream side of the sample accommodation part in the scanning direction. This sample accommodation disk makes it possible to smoothly obtain a fluorescence image.
(FR) L'invention concerne un disque de réception d'échantillon qui comprend un substrat, des pistes formées sur la surface supérieure du substrat de manière à former un cercle autour du centre du disque, et des parties de réception d'échantillon qui sont disposées au-dessus des pistes et qui logent un échantillon. Les pistes sont conçues de façon à être balayées dans une direction de balayage. Pour chaque partie de piste des pistes qui passe sous une partie de réception d'échantillon, des signaux d'adresse indiquant la position de la partie de piste sont enregistrés sur le côté amont et le côté aval de la partie de réception d'échantillon dans la direction de balayage. Le disque de réception d'échantillon permet d'obtenir avec aisance une image de fluorescence.
(JA) 試料収容ディスクは、基板と、ディスク中心の周りを旋回するように基板の上面に形成されたトラックと、トラックの上側に配置され試料を収容する試料収容部とを備える。トラックは走査方向に走査されるように構成されている。トラックのうちの試料収容部を跨ぐトラック部分の走査方向における試料収容部の上流側と下流側とにトラック部分の位置を示すアドレス信号がそれぞれ記録されている。この試料収容ディスクは、蛍光画像を円滑に取得することができる。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, JP, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)