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|1. (WO2017154744) MANUFACTURING FACILITY MANAGEMENT OPTIMIZATION DEVICE|
|Title:||MANUFACTURING FACILITY MANAGEMENT OPTIMIZATION DEVICE|
This manufacturing facility management optimization device (1): on the basis of an operation condition (X) of a manufacturing facility, creates, in a simulated manner in time series, an operation state (Y) which includes a measurement value, product yield, and quantities of raw materials consumed, of the manufacturing facility; detects an anomaly from the created operation state; identifies maintenance (M) which corresponds to the detected anomaly, corrects the operation condition on the basis of the identified maintenance, and creates a plurality of post-correction operation condition candidates; creates, in a simulated manner in time series, a plurality of post-correction operation state candidates on the basis of the plurality of post-correction operation condition candidates; on the basis of the product yield and the quantities of raw materials consumed in the plurality of pre- and post-correction operation state candidates, and a unit price (P), creates a management index (Z) for the operation state and each of the plurality of post-correction operation state candidates; and, from among the plurality of post-correction operation condition candidates, identifies the candidate which optimizes the management index.