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1. (WO2017154744) MANUFACTURING FACILITY MANAGEMENT OPTIMIZATION DEVICE

Pub. No.:    WO/2017/154744    International Application No.:    PCT/JP2017/008364
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Fri Mar 03 00:59:59 CET 2017
IPC: G06Q 10/00
G05B 19/418
G06Q 50/04
Applicants: HITACHI, LTD.
株式会社日立製作所
Inventors: YAMAMOTO Hiroki
山本 浩貴
MUKAIDE Masaaki
向出 正明
HORI Yoshinari
堀 嘉成
TERASAKI Takeshi
寺崎 健
Title: MANUFACTURING FACILITY MANAGEMENT OPTIMIZATION DEVICE
Abstract:
This manufacturing facility management optimization device (1): on the basis of an operation condition (X) of a manufacturing facility, creates, in a simulated manner in time series, an operation state (Y) which includes a measurement value, product yield, and quantities of raw materials consumed, of the manufacturing facility; detects an anomaly from the created operation state; identifies maintenance (M) which corresponds to the detected anomaly, corrects the operation condition on the basis of the identified maintenance, and creates a plurality of post-correction operation condition candidates; creates, in a simulated manner in time series, a plurality of post-correction operation state candidates on the basis of the plurality of post-correction operation condition candidates; on the basis of the product yield and the quantities of raw materials consumed in the plurality of pre- and post-correction operation state candidates, and a unit price (P), creates a management index (Z) for the operation state and each of the plurality of post-correction operation state candidates; and, from among the plurality of post-correction operation condition candidates, identifies the candidate which optimizes the management index.