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1. (WO2017154567) SAMPLE ANALYSIS METHOD AND SAMPLE ANALYSIS DEVICE

Pub. No.:    WO/2017/154567    International Application No.:    PCT/JP2017/006474
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Thu Feb 23 00:59:59 CET 2017
IPC: G01N 21/64
G01N 33/49
G01N 35/00
G01N 35/02
Applicants: PANASONIC CORPORATION
パナソニック株式会社
Inventors: YAMAMOTO Takeki
山本 健樹
NAGATOMI Kenji
永冨 謙司
SOFUE Yasuyuki
祖父江 靖之
MAMIYA Yasuhiro
間宮 靖裕
Title: SAMPLE ANALYSIS METHOD AND SAMPLE ANALYSIS DEVICE
Abstract:
A sample analysis method comprises: injecting a sample including a plurality of targets into a detection plate before or after the detection plate is arranged on a rotational drive unit; causing the sample to expand in a detecting portion of the detection plate so as to cause the plurality of targets to become adsorbed onto an inner face of the detecting portion; after the sample has expanded in the detecting portion, controlling the rotational drive unit to cause the detection plate to rotate so that centrifugal force acts on the plurality of targets present in the detecting portion; after the detection plate has been rotated for a predetermined time, scanning the detecting portion using an optical pickup to detect the plurality of targets adsorbed onto the detecting portion.