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1. (WO2017154190) RAYLEIGH MEASUREMENT SYSTEM AND RAYLEIGH MEASUREMENT METHOD

Pub. No.:    WO/2017/154190    International Application No.:    PCT/JP2016/057716
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Sat Mar 12 00:59:59 CET 2016
IPC: G01D 5/353
G01B 11/16
G01K 11/32
Applicants: NEUBREX CO.,LTD.
ニューブレクス株式会社
Inventors: KISHIDA Kinzo
岸田 欣増
YAMAUCHI Yoshiaki
山内 良昭
Title: RAYLEIGH MEASUREMENT SYSTEM AND RAYLEIGH MEASUREMENT METHOD
Abstract:
In the present invention, when the correlation between initial data and target data in the frequency range of Rayleigh scattered light is determined, through the comparison of analysis results for the initial Rayleigh scattering spectrum (RSS) obtained from initial data measurement and analysis results for the target RSS obtained from target data measurement, previously obtained target RSS analysis results are subjected to distance correction, and Rayleigh spectral shift is determined on the basis of the correlation coefficient between the target RSS after distance correction and the initial RSS.