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1. (WO2017152567) OSCILLOSCOPE PROBE, METHOD, APPARATUS AND SYSTEM FOR TESTING RIPPLE

Pub. No.:    WO/2017/152567    International Application No.:    PCT/CN2016/091527
Publication Date: Fri Sep 15 01:59:59 CEST 2017 International Filing Date: Tue Jul 26 01:59:59 CEST 2016
IPC: G01R 1/067
G01R 13/00
Applicants: ZTE CORPORATION
中兴通讯股份有限公司
Inventors: LI, Weilong
李为龙
SUN, Fengyan
孙凤艳
Title: OSCILLOSCOPE PROBE, METHOD, APPARATUS AND SYSTEM FOR TESTING RIPPLE
Abstract:
An oscilloscope probe, method, apparatus and system for testing a ripple. The oscilloscope probe comprises a first connector (22) connected to an oscilloscope, and a signal probe (24) and a ground probe (26), wherein the signal probe (24) is connected to the first connector (22) via a cable (28); and the ground probe (26) comprises a sleeve (262), a double-ended spring (264) and a ground needle point (266). The ground probe (26) is connected to the signal probe (24) via a second connector (210), wherein the double-ended spring (264) is located inside the sleeve (262); a first end of the double-ended spring (264) is in contact with the ground needle point (266); and a second end of the double-ended spring (264) is fixed on the second connector (210). The oscilloscope probe solves the problem in the relevant art that it is not easy to test a small packaged device in a ripple test, thus improving the quality and efficiency of the ripple test.