Some content of this application is unavailable at the moment.
If this situation persist, please contact us atFeedback&Contact
1. (WO2017150669) ION SENSOR, ION CONCENTRATION MEASUREMENT METHOD, AND ELECTRONIC COMPONENT
Latest bibliographic data on file with the International Bureau    Submit observation

Pub. No.: WO/2017/150669 International Application No.: PCT/JP2017/008283
Publication Date: 08.09.2017 International Filing Date: 02.03.2017
IPC:
G01N 27/414 (2006.01) ,G01N 27/30 (2006.01) ,G01N 27/416 (2006.01)
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
26
by investigating electrochemical variables; by using electrolysis or electrophoresis
403
Cells and electrode assemblies
414
Ion-sensitive or chemical field-effect transistors, i.e. ISFETS or CHEMFETS
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
26
by investigating electrochemical variables; by using electrolysis or electrophoresis
28
Electrolytic cell components
30
Electrodes, e.g. test electrodes; Half-cells
G PHYSICS
01
MEASURING; TESTING
N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
27
Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
26
by investigating electrochemical variables; by using electrolysis or electrophoresis
416
Systems
Applicants:
学校法人早稲田大学 WASEDA UNIVERSITY [JP/JP]; 東京都新宿区戸塚町1丁目104番地 104 Totsukamachi 1-chome, Shinjuku-ku, Tokyo 1698050, JP
横河電機株式会社 YOKOGAWA ELECTRIC CORPORATION [JP/JP]; 東京都武蔵野市中町2丁目9番32号 9-32, Naka-cho 2-chome, Musashino-shi, Tokyo 1808750, JP
Inventors:
川原田 洋 KAWARADA Hiroshi; JP
稲葉 優文 INABA Masafumi; JP
モフド スクリ シャイリ ファリナ ビンチ Mohd Sukri Shaili Falina Binti; JP
楢村 卓朗 NARAMURA Takuro; JP
五十嵐 圭為 IGARASHI Keisuke; JP
新谷 幸弘 SHINTANI Yukihiro; JP
小河 晃太朗 OGAWA Kotaro; JP
Agent:
棚井 澄雄 TANAI Sumio; JP
佐伯 義文 SAEKI Yoshifumi; JP
高橋 久典 TAKAHASHI Hisanori; JP
沖田 壮男 OKITA Takeo; JP
Priority Data:
2016-04036002.03.2016JP
2017-03150422.02.2017JP
Title (EN) ION SENSOR, ION CONCENTRATION MEASUREMENT METHOD, AND ELECTRONIC COMPONENT
(FR) CAPTEUR D'IONS, PROCÉDÉ DE MESURE DE CONCENTRATION D'IONS, ET COMPOSANT ÉLECTRONIQUE
(JA) イオンセンサ、イオン濃度測定方法、および電子部品
Abstract:
(EN) An electronic component that is characterized by comprising: an electric field effect transistor that constitutes a working electrode for an ion sensor; and a drive circuit that generates a potential difference between a source electrode and a drain electrode of the electric field effect transistor. The electronic component is also characterized in that the electric field effect transistor has a fixed reference electrode potential.
(FR) L'invention concerne un composant électronique qui est caractérisé en ce qu'il comprend : un transistor à effet de champ électrique qui constitue une électrode de travail pour un capteur d'ions ; et un circuit d'attaque qui génère une différence de potentiel entre une électrode de source et une électrode de drain du transistor à effet de champ électrique. Le composant électronique est également caractérisé en ce que le transistor à effet de champ électrique a un potentiel d'électrode de référence fixe.
(JA) イオンセンサの作用極を構成する電界効果トランジスタと、前記電界効果トランジスタのソース電極とドレイン電極との間に電位差を生じさせる駆動回路と、を備え、前記電界効果トランジスタの参照極電位が固定されていることを特徴とする電子部品。
front page image
Designated States: AE, AG, AL, AM, AO, AT, AU, AZ, BA, BB, BG, BH, BN, BR, BW, BY, BZ, CA, CH, CL, CN, CO, CR, CU, CZ, DE, DJ, DK, DM, DO, DZ, EC, EE, EG, ES, FI, GB, GD, GE, GH, GM, GT, HN, HR, HU, ID, IL, IN, IR, IS, KE, KG, KH, KN, KP, KR, KW, KZ, LA, LC, LK, LR, LS, LU, LY, MA, MD, ME, MG, MK, MN, MW, MX, MY, MZ, NA, NG, NI, NO, NZ, OM, PA, PE, PG, PH, PL, PT, QA, RO, RS, RU, RW, SA, SC, SD, SE, SG, SK, SL, SM, ST, SV, SY, TH, TJ, TM, TN, TR, TT, TZ, UA, UG, US, UZ, VC, VN, ZA, ZM, ZW
African Regional Intellectual Property Organization (ARIPO) (BW, GH, GM, KE, LR, LS, MW, MZ, NA, RW, SD, SL, ST, SZ, TZ, UG, ZM, ZW)
Eurasian Patent Office (AM, AZ, BY, KG, KZ, RU, TJ, TM)
European Patent Office (EPO) (AL, AT, BE, BG, CH, CY, CZ, DE, DK, EE, ES, FI, FR, GB, GR, HR, HU, IE, IS, IT, LT, LU, LV, MC, MK, MT, NL, NO, PL, PT, RO, RS, SE, SI, SK, SM, TR)
African Intellectual Property Organization (BF, BJ, CF, CG, CI, CM, GA, GN, GQ, GW, KM, ML, MR, NE, SN, TD, TG)
Publication Language: Japanese (JA)
Filing Language: Japanese (JA)